X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors

Wheater, R.M.; Jowitt, Lydia; Richards, S.; Veale, Matthew C.; Wilson, M.N.; Fox, Oliver; Sawhney, Kawal; Lozinskaya, A.; Shemeryankina, A.; Толбанов, О. П.; Tyazhev, A.; Zarubin, A.

doi:10.1016/j.nima.2021.165207

Cited by 6 publications

(3 citation statements)

References 12 publications

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“…Calibration results are shown in figure 3. It can be seen that the K𝛼1 ≈ 22.16 keV and K𝛽1 ≈ 24.94 XRF quanta are clearly distinguished in the amplitude spectrum (figure 3, left), which makes it possible to estimate the energy resolution of the detector at the level of 3 keV (FWHM -full width at half-maximum) at room temperature that corresponds to previous investigations [8][9][10][11].…”

Section: Experimental Verification Of the Methods Using A Gaas Hexite...supporting

confidence: 57%

The fractional composition calculation of two-component mixtures using direct and scattered X-rays: a new methodology testing

et al. 2023

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Continuous monitoring and control of hydrocarbon flow is not a new task. Today, there are many engineering solutions in flow measurement that are used in commercial applications. However, the search for other solutions continues and is associated with the emergence of new technical challenges of the oil and gas industry. There is also a constant request for optimization of already working flow-metering solutions. In the present work we propose a methodology to calculate the composition of a mixture using gamma densitometry methods with direct and scattered radiation tracking. Experiments were carried out on reference samples and ways of practical implementation of the proposed methodology are shown.

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Section: Experimental Verification Of the Methods Using A Gaas Hexite...supporting

confidence: 57%

The fractional composition calculation of two-component mixtures using direct and scattered X-rays: a new methodology testing

et al. 2023

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“…Several studies have thoroughly characterized GaAs:Cr sensors with pixel pitches between 55 and 250 μm and encountered additional challenges such as non-uniformities leading to variations in the effective pixel size [3,[9][10][11][12][13].…”

Section: Jinst 17 P04007mentioning

confidence: 99%

“…The novelty of this work lies in the use of a very small pixel pitch charge integrating detector, which allows to measure the charge cloud distribution of every photon with higher spatial resolution in comparison to previous works performed with high-Z sensors bump-bonded to SPC detectors [12,17,18].…”

Section: Jinst 17 P04007mentioning

confidence: 99%

High-spatial resolution measurements with a GaAs:Cr sensor using the charge integrating MÖNCH detector with a pixel pitch of 25 μm

Chiriotti¹,

Barten²,

Bergamaschi³

et al. 2022

J. Inst.

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The aim of this project is to determine the imaging capabilities of a 25 μm pixel pitch GaAs:Cr sensor of 500 μm thickness bump-bonded to the charge integrating MÖNCH 03 readout chip (also called GaAs-MÖNCH assembly) and to assess the possibility to improve the spatial resolution by applying a position interpolation algorithm developed at PSI. Measurements were performed at the TOMCAT beamline of the Swiss Light Source (SLS) using photon beams in the energy range of 10–30 keV. The imaging experiments indicate the possibility to enhance the spatial resolution of the detector beyond its actual physical pixel pitch. We have quantified the spatial resolution of a GaAs-MÖNCH assembly by means of the modulation transfer function (MTF), achieving 10 μm at 10 keV and 12 μm at 20 keV photon energies. By applying a modified interpolation algorithm, a spatial resolution of ∼5 μm was obtained for 16 keV when binning to 2.5 μm virtual pixels, while with the silicon-MÖNCH assembly, we achieved a spatial resolution of 3.5 μm, which serves as gold standard. The results are promising because they open new possibilities to perform imaging measurements using the GaAs-MÖNCH assembly at photon energies above 15 keV, where silicon sensors suffer from a diminishing quantum efficiency.

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Introduction to Detector Technologies

Hansson,

Iniewski

2023

X-Ray Photon Processing Detectors

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X-ray microbeam characterisation of crystalline defects in small pixel GaAs:Cr detectors

Cited by 6 publications

References 12 publications

The fractional composition calculation of two-component mixtures using direct and scattered X-rays: a new methodology testing

The fractional composition calculation of two-component mixtures using direct and scattered X-rays: a new methodology testing

High-spatial resolution measurements with a GaAs:Cr sensor using the charge integrating MÖNCH detector with a pixel pitch of 25 μm

Introduction to Detector Technologies

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