2014
DOI: 10.1063/1.4865496
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X-ray nano-diffraction study of Sr intermetallic phase during solidification of Al-Si hypoeutectic alloy

Abstract: The evolution of strontium (Sr) containing intermetallic phase in the eutectic reaction of Sr-modified Al-Si hypoeutectic alloy was studied with high energy synchrotron beam source for nano-diffraction experiments and x-ray fluorescence elemental mapping. Contrary to popular belief, Sr does not seem to interfere with the Twin Plane Re-entrant Edge (TPRE) growth mechanism of eutectic Si, but evolves as the Al2Si2Sr phase during the eutectic reaction at the boundary between the eutectic Si and Al grains.

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Cited by 17 publications
(11 citation statements)
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“…5b 2 ). The present result suggests that the morphology modification of eutectic Si crystals occurs at the growth stage, being realized through ''poisoning'' of twin re-entrants as proposed and verified recently by many investigations [1,18,24,25,36]. The Sr modifier can be considered to restrict further growth of eutectic Si crystals associated with the original {1 1 1} twinning planes, which is in accordance with the restricted TPRE growth mechanism [12].…”
Section: Restricted Growth Of Sr-modified Eutectic Sisupporting
confidence: 85%
See 1 more Smart Citation
“…5b 2 ). The present result suggests that the morphology modification of eutectic Si crystals occurs at the growth stage, being realized through ''poisoning'' of twin re-entrants as proposed and verified recently by many investigations [1,18,24,25,36]. The Sr modifier can be considered to restrict further growth of eutectic Si crystals associated with the original {1 1 1} twinning planes, which is in accordance with the restricted TPRE growth mechanism [12].…”
Section: Restricted Growth Of Sr-modified Eutectic Sisupporting
confidence: 85%
“…The latter mechanism assumes that chemical modifiers poison Si re-entrant grooves, thereby deactivating anisotropic TPRE growth. To verify possible modification mechanisms, detailed investigations on modifier distributions have been performed using high-resolution characterization techniques [17,23], such as three-dimensional atom probe tomography (APT) and transmission electron microscopy (TEM) [1,24,25]. A recent study by high-resolution TEM and atomic-resolution scanning electron microscopy (SEM) [26] revealed that Sr atoms are adsorbed along the h1 1 2i growth directions of Si crystals and/or at the intersections of multiple Si twins, thus evidencing an important role of the Sr modifier in the IIT growth and the restricted TPRE growth.…”
Section: Introductionmentioning
confidence: 99%
“…Efforts to reveal the distribution of the modifier elements in the eutectic phase show submicrometer strontium-rich intermetallics (most likely Al2Si2Sr) adjacent to eutectic silicon crystals [100,142]. A relatively homogeneous distribution of strontium and sodium is shown to be exclusively incorporated into the silicon phase [100,142,143].…”
Section: Recent Developmentsmentioning
confidence: 99%
“…Synchrotron-based X-ray nanodiffraction and X-ray fluorescence (XRF) elemental mapping have also been used to confirm the presence of intermetallic Sr phases in Sr-modified Al-Si alloys. 69 According to Schumacher and coworkers, such nanoscale co-segregates (clusters) are likely subcritical nuclei, and the local ordering of the melt would be that of fluctuating clusters. 70 Stable clusters would require heterogeneous substrates or high undercooling.…”
Section: B Modification During Growthmentioning
confidence: 99%