X-ray phase analysis of carbon nanotubes obtained by the arc discharge method

Abstract

In the presented article, the purity, quality, and surface morphology of graphite, carbon nanotube, and functionalized carbon nanotube were comparatively studied by scanning electron microscopy (SEM), energy dispersive (EXD) methods, X-ray phase analysis. It was determined that the diffraction peaks of the X-ray phase analyses of the carbon nanotube obtained by the arc discharge method depend on the morphological properties of the substance and allow obtaining initial information about the dimensions of the carbon nanotube and the distance between the walls.