1993
DOI: 10.1002/sia.740201308
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X‐ray photoelectron diffraction studies of the surface chemistry of non‐stoichiometric synthetic spinel

Abstract: Angle-resolved XPS data from a synthetic spinel crystal of approximate composition MgO *(3.4)AI20, are reprted and discussed. Strong x-ray photoelectron dieaction (XPD) effects were observed both in argon ion bombarded/annealed surfaces (which were grossly magnesium-deficient) and in chemically etched surfaces prepared by treatment with sodium peroxide at 480°C followed by an acid wash. Many major features of the XPD patterns could be explained using the enhanced forward scattering concept. The relative magnit… Show more

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Cited by 2 publications
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“…Magnesium, in contrast, has no nearest neighbor in this direction and its emission intensity is consequently not maximal at this angle. A similar contrast occurs in the spinel structure between the tetrahedral and octahedral ion XPD (Ash and Evans 1993).…”
Section: Enhanced-forward-scattering Interpretation Of the Diffractiomentioning
confidence: 57%
“…Magnesium, in contrast, has no nearest neighbor in this direction and its emission intensity is consequently not maximal at this angle. A similar contrast occurs in the spinel structure between the tetrahedral and octahedral ion XPD (Ash and Evans 1993).…”
Section: Enhanced-forward-scattering Interpretation Of the Diffractiomentioning
confidence: 57%