X-ray Photoelectron Spectroscopic and Atomic Force Microscopic Studies of Pyrolytically Coated Graphite and Highly Oriented Pyrolytic Graphite Used for Electrothermal Vaporization

Atomic Absorption, Atomic Emission, and Flame Emission Spectrometry

“…They showed that chemical species migrate into the graphite when deposited as solutions, but not when deposited by vapor deposition or laser ablation. Galbacs et al(184) used sputter etching and X-ray photoelectron spectroscopy for depth profiling and observed the migration of Cd and As (introduced as solutions) into the graphite. They also used atomic force microscopy to study the changes in graphite surface characteristics resulting from their interaction with solid samples.…”