2023
DOI: 10.3390/ma16165504
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X-ray Photoelectron Spectroscopy Analysis of Scandia-Ceria-Stabilized Zirconia Composites with Different Transport Properties

Abstract: This work aims to study a possible modification in the electronic structure of scandia-ceria-stabilized zirconia (10Sc1CeSZ) ceramics sintered at different temperatures. In addition to using X-ray diffraction (XRD), scanning electron microscopy (SEM) and impedance spectroscopy to investigate the structural and electrical properties, we employed X-ray photoelectron spectroscopy (XPS) to determine the chemical state information of the atoms involved, along with compositional analysis. As expected, a significant … Show more

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Cited by 3 publications
(2 citation statements)
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“…The solution of this problem lies in additional material doping of small amounts of ceria (1 mol%) resulting in stabilization of the material cubic structure. A number of studies in the ternary system has been carried out so far [44][45][46][47][48][49][50][51][52][53][54][55][56][57][58][59][60].…”
Section: Introductionmentioning
confidence: 99%
“…The solution of this problem lies in additional material doping of small amounts of ceria (1 mol%) resulting in stabilization of the material cubic structure. A number of studies in the ternary system has been carried out so far [44][45][46][47][48][49][50][51][52][53][54][55][56][57][58][59][60].…”
Section: Introductionmentioning
confidence: 99%
“…In this case, due to the ballistic nature of this process, the buildup of a lattice disorder occurs and it is accompanied by the formation of various types of defects in relatively large concentrations. Recent experimental studies of β-Ga 2 O 3 :Si system prepared by ion implantation with Si ions show that Si interstitials occur in large concentration but not as isolated atoms but as complexes of Si i with gallium and/or oxygen vacancies . Thus, to better understand the changes in the properties of β-Ga 2 O 3 and gallium oxide-based materials, the most favorable interstitial sites should be identified through further analysis and simulations.…”
Section: Introductionmentioning
confidence: 99%