The passive oxide film on SUS 304 stainless steel (SS) was studied in a 0.1 mol dm −3 sulfuric acid solution as a function of passivation time. The passive oxide films were measured by ellipsometry and X-ray photoelectron spectroscopy (XPS). A Mott-Schottky plot of the film capacitance was employed to determine the donor density in the n-type semiconducting oxide film, and current measurements of the Fe 3+ /Fe 2+ redox couple were employed to investigate the electronic transfer process on the passive oxide film. The passive oxide consists of Cr-Fe-Ni oxides in which enrichment of Cr to 57 mol% occurs as the potential increases. During the aging of the passive oxide at 0.6 V vs. Ag/AgCl/saturated KCl (SSC) for 43 ks, the current decreased from 30 μA cm −2 at 10 s to 0.025 μA cm −2 at 43 ks, and the Cr ratio in the oxide increased from 49 to 57 mol% with an increase in the O 2-ratio. Notably, the film thickness remained nearly constant at 1.3 nm during the aging process. Enrichment of the Cr content resulted in a decrease in the donor density of the n-type semiconducting passive oxide and the inhibition of electronic charge transfer from/to the Fe 3+ /Fe 2+ redox couple in the electrolyte. The corrosion resistance of stainless steel is the result of surface passive films enriched in chromium. The passive oxide film on conventional austenitic stainless steel (SS) SUS304 has been investigated with a focus on its composition, 1-6 thickness 7-9 and semiconducting properties. 5,6,[10][11][12][13][14][15][16][17][18][19][20] For the oxide formed in an acidic aqueous solution, the chromium oxide component was enriched to a ratio of approximately 50-60 mol % in passive oxide in an acidic aqueous solution.
1-3Its thickness was estimated by ellipsometry to be 1-2 nm. 8,20 In neutral and slightly alkaline solutions, the passive oxide consists of an inner chromium-rich oxide layer and an outer iron-rich oxide layer. [4][5][6] The semiconducting properties of passive oxides 5,6,[10][11][12][13][14][15][16][17][18][19][20] has been estimated from a Mott-Schottky plot of the capacitance data and photoelectrochemical measurements. The Mott-Schottky plot in the potential range, in which little reduction of the film occurs, indicated that the passive oxide had an n-type semiconducting property. 6,10,13,16,19,21 However, the results of photo-electrochemical measurement indicated that the passive oxide had both n-type and p-type semiconducting properties. 5,17,18 Because there are no in situ techniques available to determine the composition of the thin passive oxide on 304 SS, ex-situ spectroscopies performed in vacuum, such as X-ray photoelectron spectroscopy (XPS) [1][2][3][4]6 and Auger electron spectroscopy (AES), 4,5 have been used to obtain this information. Additionally, the film composition and structure were determined using simulations involving photoelectron signals and the attenuation of these signals of the ionic and metallic species. For the anodic passive oxide on 304 SS and on Fe-Cr alloys in sulfuric acid solutions, ...