1999
DOI: 10.1016/s0169-4332(99)00145-2
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X-ray photoelectron spectroscopy of nickel dithiolene complex Langmuir–Blodgett films

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Cited by 8 publications
(5 citation statements)
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“…2e. This oxidised sulphur peak could be due to the absorbed oxygen in Co(dtc-SB) NWs (Yang, Sun, Guo, & Da, 1999). Peak at 531.1eV in O 1s indicates the presence of Co-O-H in the structure (Atzei et al, 2000;Baba et al 2012).…”
Section: /2 Xy(imentioning
confidence: 96%
“…2e. This oxidised sulphur peak could be due to the absorbed oxygen in Co(dtc-SB) NWs (Yang, Sun, Guo, & Da, 1999). Peak at 531.1eV in O 1s indicates the presence of Co-O-H in the structure (Atzei et al, 2000;Baba et al 2012).…”
Section: /2 Xy(imentioning
confidence: 96%
“…The metal–oxygen bond signal located at 529.4 eV was attributed to the Ni–O signal in the O 1s spectrum (Figure d), indicating a small amount of Ni–O. The S 2p is composed of two main peaks at 162.4 and 163.3 eV, corresponding to S 2p 3/2 and S 2p 1/2 , respectively, suggesting the −2 oxidation state in Ni 3 S 2 . Moreover, the weak peak at 168.6 eV hints at the formation of S–O bonds by oxidation on the surface of S (Figure e) …”
Section: Resultsmentioning
confidence: 98%
“…44 Moreover, the weak peak at 168.6 eV hints at the formation of S−O bonds by oxidation on the surface of S (Figure 4e). 47 N 2 adsorption/desorption curves of Ni−S−C T catalyst material at 77 K were shown in Figure S7. All of the pyrolyzed products showed H4-type hysteresis loops, indicating the inclusion of a mesoporous structure.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…An exhaustive review of surface-sensitive methods that have been used to characterize surfactants at the solution−vapor interface can be found in refs 8,16. One of the most popular surface-sensitive characterization methods, X-ray photoelectron spectroscopy (XPS), has been widely used to study surfactant layers after they have been transferred onto solid substrates using the Langmuir− Blodgett and other preparation methods 17,18 but to the best of our knowledge has not yet been applied to investigations of surfactants at the solution−vapor interface. XPS provides information on the elemental composition and the chemical nature of the species at the interface (e.g., functional groups) and is thus ideally suited for investigations of heterogeneous chemical reactions involving the gas phase, surfactants at the interface, as well as solvent and solute molecules in the solution (see Figure 1).…”
Section: ■ Introductionmentioning
confidence: 99%
“…An exhaustive review of surface-sensitive methods that have been used to characterize surfactants at the solution–vapor interface can be found in refs , . One of the most popular surface-sensitive characterization methods, X-ray photoelectron spectroscopy (XPS), has been widely used to study surfactant layers after they have been transferred onto solid substrates using the Langmuir–Blodgett and other preparation methods , but to the best of our knowledge has not yet been applied to investigations of surfactants at the solution–vapor interface.…”
Section: Introductionmentioning
confidence: 99%