Herein we report on how to render Ti 3 C 2 T x (MXene) monolayers deposited on SiO 2 /Si wafers, with different SiO 2 thicknesses, visible. Inputting the effective thickness of a Ti 3 C 2 T x monolayer (1 ± 0.2 nm) measured by atomic force microscopy, and its refractive index into a Fresnel-law-based simulation software, we show that the optical contrast of Ti 3 C 2 T x monolayers deposited on SiO 2 /Si wafers depends on the SiO 2 thickness, number of MXene layers, and the light's wavelength. The highest contrast was found for SiO 2 thicknesses around 220 nm. Simulations for other substrates, namely, Al 2 O 3 /Si, HfO 2 /Si, Si 3 N 4 /Si and Al 2 O 3 /Al, are presented as supplementary information.
IMPACT STATEMENTThe experimental and simulated color contrasts between Ti 3 C 2 T x (MXene) monoflakes deposited on SiO 2 of various thicknesses-under an optical microscope-were obtained for the first time.
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