1974
DOI: 10.1103/physrevb.9.5268
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X-ray photoemission studies of diamond, graphite, and glassy carbon valence bands

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Cited by 542 publications
(161 citation statements)
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“…The spectra shown have not been corrected or processed apart from a background subtraction. The calibration of our instrument was confirmed by measuring a clean sample of highly oriented pyrolytic graphite, which gives a sharp C 1s peak centered at 284.4 eV and FWHM of 1.2 eV, in good agreement with the literature (30,41). The fitting process, quantitative analysis, and error estimation were performed using the CasaXPS software.…”
Section: Methodsmentioning
confidence: 54%
See 1 more Smart Citation
“…The spectra shown have not been corrected or processed apart from a background subtraction. The calibration of our instrument was confirmed by measuring a clean sample of highly oriented pyrolytic graphite, which gives a sharp C 1s peak centered at 284.4 eV and FWHM of 1.2 eV, in good agreement with the literature (30,41). The fitting process, quantitative analysis, and error estimation were performed using the CasaXPS software.…”
Section: Methodsmentioning
confidence: 54%
“…The abundance of ethers included in soot particles increases with increasing DFFO, suggesting that alcohols/enols are precursors to ethers. The fractions of C-OH, C-O-C, and C=O species at different DFFOs were determined by analysis of the O 1s spectra (30,41) and are shown in Fig. 6D.…”
Section: Resultsmentioning
confidence: 99%
“…Manne [16] has discussed the comparison of x-ray photoemission (XPS) and x-ray emission (XES) spectra. By combining these ideas and applying them to solids, we have been able to deduce the atomic-orbital compositions of diamond and graphite [17]. The diamond case is illustrated in Fig.…”
Section: Insertion Of Experimental Valuesmentioning
confidence: 99%
“…It indicates that the surfaces of Si-DLC films are rich in sp 2 bonded carbon. Another peak at 292.7 eV was attributed to π-excitation, which appears in all carbon compounds having double bonds [27][28][29]. The Si 2p spectrum was deconvoluted into five components with a strong peak for Si-C (Si 1+) bond at 100.7 eV and two small peaks for Si 2 O 3 (Si 3+) and SiO 2 (Si 4+) type of binding at 102.3 eV and 103.4 eV respectively (the number in bracket denotes the oxidation state of Si).…”
Section: X-ray Photoelecron Spectroscopy (Xps) Studiesmentioning
confidence: 99%
“…5 (g)) was deconvoluted into five components at 284.4, 285.1, 286.6, 288.5 and 293.5 eV. These peak positions are assigned to the binding energy of C _ C, C-C, C-O, C _ O bonded network and π-excitation respectively [25][26][27][28][29]45]. The ratio of the C _ C to C-C bonds was similar to that of the untreated Si-DLC film shown in Fig.…”
Section: X-ray Photoelecron Spectroscopy (Xps) Studiesmentioning
confidence: 99%