2015
DOI: 10.1007/s10854-015-3735-3
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X-ray reflectivity and topography of the solvent-treated P3HT:PCBM thin films

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Cited by 4 publications
(3 citation statements)
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“…In a first approximation, the entire electron density of the film can be assumed to be uniform along the depth justifying the single box fitting. However, there may be slight gradation or undulations in the electron density along the depth resulting in poor fitting for a single box regime [40,41]. In the data fitting scheme, the film was divided into 4-5 layers in a recursive scheme to obtain a good fit.…”
Section: Experimental Analysismentioning
confidence: 99%
“…In a first approximation, the entire electron density of the film can be assumed to be uniform along the depth justifying the single box fitting. However, there may be slight gradation or undulations in the electron density along the depth resulting in poor fitting for a single box regime [40,41]. In the data fitting scheme, the film was divided into 4-5 layers in a recursive scheme to obtain a good fit.…”
Section: Experimental Analysismentioning
confidence: 99%
“…Overall, according to the above DSC data, the attachment of the bulky C 60 either as the end group in the case of dyads, or linked to the main chain/side chain junction point in the case of brush polymer, appeared to have some minor impact on the crystallization behavior of the P3HT units. Moreover, all XRD profiles ( Figure 17 ) of P3HT-(CH 2 ) 3 -VIM-C 60 and brush polymer adduct P[P3HT-(CH 2 ) 3 -VIM-C 60 ] showed a sharp peak at 5.30° to 5.53°, which is associated with the (100) reflection of P3HT [ 48 , 49 , 50 , 51 ]. In addition, intense peaks at 10.7° to 10.9°, as well as those appeared at 20.66° and 23.1°, associated with the adduct formation, were also observed.…”
Section: Resultsmentioning
confidence: 99%
“…Recently, neutron reflectivity (NR), x-ray reflectivity (XRR), and x-ray photoelectron spectr oscopy (XPS) were used to probe vertically buried interfaces and their structure within OSC devices [18][19][20][21][22][23]. The NR and XRR techniques are very promising to study the grain size distribution, roughness at the interfaces and the density profile of thin films along the path light travels in OSC devices [24][25][26].…”
Section: Introductionmentioning
confidence: 99%