2013
DOI: 10.1107/s1600577513021516
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X-ray reflectivity measurements of liquid/solid interfaces under high hydrostatic pressure conditions

Abstract: A high-pressure cell for in situ X-ray reflectivity measurements of liquid/solid interfaces at hydrostatic pressures up to 500 MPa (5 kbar), a pressure regime that is particularly important for the study of protein unfolding, is presented. The original set-up of this hydrostatic high-pressure cell is discussed and its unique properties are demonstrated by the investigation of pressure-induced adsorption of the protein lysozyme onto hydrophobic silicon wafers. The presented results emphasize the enormous potent… Show more

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Cited by 30 publications
(23 citation statements)
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“…The depletion is due, arguably [41][42][43][44] , to the monolayer's lower-density CH 3 terminal group, found also for surface-frozen alkanes 36 and alcohols 45 , at and at SAM/water interfaces. [46][47][48][49] As previously demonstrated 36,41 , the strong coupling between ρ and d in a thin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 slab does not allow their independent fit, only that of their product. Thus, the depletion layer's density was fixed at ρ 4 = 0.1 e/Å 3 and only d 4 and σ 4 were refined.…”
Section: Surface Normal Structurementioning
confidence: 99%
“…The depletion is due, arguably [41][42][43][44] , to the monolayer's lower-density CH 3 terminal group, found also for surface-frozen alkanes 36 and alcohols 45 , at and at SAM/water interfaces. [46][47][48][49] As previously demonstrated 36,41 , the strong coupling between ρ and d in a thin 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 slab does not allow their independent fit, only that of their product. Thus, the depletion layer's density was fixed at ρ 4 = 0.1 e/Å 3 and only d 4 and σ 4 were refined.…”
Section: Surface Normal Structurementioning
confidence: 99%
“…For the measurements a reflectivity sample cell developed for applying hydrostatic pressure was used [32]. The experiments were performed with an X-ray wavelength of k = 0.452 Å.…”
Section: X-ray Reflectivity Xrr Measurementsmentioning
confidence: 99%
“…XRR experiments were performed in a custom‐built pressure cell . The sample system consisted of OTS‐covered silicon wafers with a surface of 7.8×7.8 mm 2 in 350 μl of ultrapure water (MilliQ, resistance R= 18.2 MΩcm).…”
Section: Figurementioning
confidence: 99%