X-ray scattering: A powerful probe of lattice strain in materials with small dimensions

Thomas, O.; Loubens, A.; Gergaud, P.; Labat, S.

doi:10.1016/j.apsusc.2006.05.082

Cited by 7 publications

(4 citation statements)

References 26 publications

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“…Tensile tests are more effective and convenient for producing uniform stress and strain fields, which enables more unambiguous property measurements to be taken compared with the other techniques Faurie et al, 2009Faurie et al, , 2010Geandier, Thiaudiè re et al, 2010). Furthermore, synchrotron X-ray diffraction (XRD) provides a powerful phase-selective and nondestructive method of probing the lattice strains in nanocomposite thin films where the diffracting volumes are very small (Geandier et al, 2008;Thomas et al, 2006). Another approach for strain measurements on sample surfaces is provided by digital image correlation (DIC).…”

Section: Introductionmentioning

confidence: 99%

Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

et al. 2011

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In situ biaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate using a biaxial testing machine developed on the DiffAbs beamline at the Synchrotron SOLEIL. The mechanical behaviour of the nanocomposite was characterized at the micro-and macroscales using synchrotron X-ray diffraction and digital image-correlation techniques simultaneously. Strain analyses for equibiaxial and non-equibiaxial loading paths were carried out. The results show that the two strain measurements match to within 1 Â 10 À4 in the elastic domain for strain levels less than 0.3% and for both loading paths.

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Section: Introductionmentioning

confidence: 99%

Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

et al. 2011

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“…Compared to that of bulk nickel, all the samples show peak broadening. All the deposited samples show almost equal shift in the peak towards lower angle (as indicated in figure through dotted line) due to increase in the lattice parameter 34. An increase in the lattice parameter indicates presence of tensile stresses in the deposits.…”

Section: Resultsmentioning

confidence: 81%

“…All the deposited samples show almost equal shift in the peak towards lower angle (as indicated in figure through dotted line) due to increase in the lattice parameter. 34 An increase in the lattice parameter indicates presence of tensile stresses in the deposits. It can be noted that tensile stresses generally result during electrodeposition of nickel.…”

Section: Resultsmentioning

confidence: 99%

Effect of current density and grain refining agents on pulsed electrodeposition of nanocrystalline nickel

Bhardwaj

Balani

Balasubramaniam

et al. 2011

Surface Engineering

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Nanocrystalline nickel was electrodeposited on copper substrate using a Watt's bath at a temperature of 50uC. The effect of pulsed current density (up to 1?5 A cm 22 ) and role of organic additives (namely saccharin and sodium citrate) in the deposition bath was evaluated for rendering grain refinement. The deposited samples were characterised for current efficiency, colonial morphology, crystallite size, texture, coercivity and nanomechanical properties (such as Young's modulus and hardness). Results were compared with deposition using direct current, and utilising annealed Cu substrate. The smallest crystallite size of 22 nm was obtained, and the lowest coercivity equaled 22 Oe for the sample deposited using pulsed current with the peak current density 1 A cm 22 and 10 g L 21 saccharin addition. Annealing of the substrate has shown to increase the Young's modulus of electrodeposited Ni by 10?2%, which increases further by 14?4% with saccharin addition when compared to those of deposits without saccharin addition.

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“…Alongside the classical powder diffraction mode, various approaches have been proposed for probing inter-and intra-granular deformation within crystalline materials (Poulsen et al, 2001;Tamura et al, 2003). The variety of techniques and arrangements that have been put forward (Sharma et al, 2012;Daymond et al, 2007;Efstathiou et al, 2010;Thomas et al, 2006;San Martin et al, 2012) allows the selection of length scales (from a few millimetres down to submicrometres) and obtaining information about various material properties (local or statistical crystal orientation, crystallographic phase composition). In particular, highenergy polychromatic beam configuration for elastic strain measurement allows fast data acquisition and lends itself well to the mapping of large sample areas (Korsunsky et al, 2002).…”

Section: Introductionmentioning

confidence: 99%

A feasibility study of dynamic stress analysis inside a running internal combustion engine using synchrotron X-ray beams

Baimpas¹,

Drakopoulos²,

Connolley³

et al. 2013

J Synchrotron Rad

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The present investigation establishes the feasibility of using synchrotron-generated X-ray beams for time-resolved in situ imaging and diffraction of the interior components of an internal combustion engine during its operation. The demonstration experiment was carried out on beamline I12 (JEEP) at Diamond Light Source, UK. The external hutch of the JEEP instrument is a large-scale engineering test bed for complex in situ processing and simulation experiments. The hutch incorporates a large capacity translation and rotation table and a selection of detectors for monochromatic and white-beam diffraction and imaging. These capabilities were used to record X-ray movies of a motorcycle internal combustion engine running at 1850 r.p.m. and to measure strain inside the connecting rod via stroboscopic X-ray diffraction measurement. The high penetrating ability and high flux of the X-ray beam at JEEP allowed the observation of inlet and outlet valve motion, as well as that of the piston, connecting rod and the timing chain within the engine. Finally, the dynamic internal strain within the moving connecting rod was evaluated with an accuracy of ~50 × 10(-6).

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X-ray scattering: A powerful probe of lattice strain in materials with small dimensions

Cited by 7 publications

References 26 publications

Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

Effect of current density and grain refining agents on pulsed electrodeposition of nanocrystalline nickel

A feasibility study of dynamic stress analysis inside a running internal combustion engine using synchrotron X-ray beams

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