2018
DOI: 10.1002/tcr.201800083
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X‐Ray Scattering and Imaging Studies of Electrode Structure and Dynamics

Abstract: We will review structures and dynamics of electrode interfaces studied in situ using x‐ray scattering and imaging techniques. The examples cover single‐crystal and nanocrystal structures relevant to electrocatalytic activities, anodic oxidation and corrosion, aqueous dissolution reactions, surface reconstructions, and surface modifications by under potential deposition. The x‐ray techniques include the widely used traditional surface x‐ray scattering, such as crystal truncation rods and x‐ray reflectivity, as … Show more

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Cited by 8 publications
(7 citation statements)
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References 105 publications
(117 reference statements)
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“…However, by changing the carbon vitreous bulk electrode to a hollow one (with carbon paper), the same cell can be used to measure in transmission mode, i. e., the beam will cross the window, pass along the SEC body and hit the detector located right behind the SEC. Alternatively, this same SEC can also be adapted to XRD in reflection mode or grazing incidence to perform measurements of GISAXS, XRR or CDI techniques using a mylar film as the window [1,25–27] …”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…However, by changing the carbon vitreous bulk electrode to a hollow one (with carbon paper), the same cell can be used to measure in transmission mode, i. e., the beam will cross the window, pass along the SEC body and hit the detector located right behind the SEC. Alternatively, this same SEC can also be adapted to XRD in reflection mode or grazing incidence to perform measurements of GISAXS, XRR or CDI techniques using a mylar film as the window [1,25–27] …”
Section: Resultsmentioning
confidence: 99%
“…Alternatively, this same SEC can also be adapted to XRD in reflection mode or grazing incidence to perform measurements of GISAXS, XRR or CDI techniques using a mylar film as the window. [1,[25][26][27] In Situ Ultrafast Spectroscopy Figure 5 shows the SEC positioned in front of two femtosecond lasers in a homemade setup for measurements involving ultrafast spectroscopy. [29,30] The cell is the same used for Raman, but it is positioned like in the XAFS experiment, i. e., parallel to the bench.…”
Section: In Situ Xas and Xrdmentioning
confidence: 99%
“…When in situ/operando cannot be accomplished or the method is destructive, ex situ characterization can still be used, granted that special attention is paid to sample preparation and transfer from the electrochemical environment to the characterization tool. Given the number of review articles present in the literature focusing on characterization tools more broadly, here we will list a range of methods as shown in Table , that are important for probing changes in composition, structure, and morphology. We separate the techniques into four broad classes, mass spectrometry, microscopy, spectroscopy, and crystallography, and highlight the benefits and unique information each method provides as well as some of their limitations.…”
Section: Tools and Techniquesmentioning
confidence: 99%
“…However, by changing the carbon vitreous bulk electrode to a hollow one (with carbon paper), the same cell can be used to measure in transmission mode. Alternatively, this same SEC can also be adapted to XRD in reflection mode or grazing incidence to perform measurements of GISAXS, XRR or CDI techniques using a mylar film as the window [1,[25][26][27] . Figure 4.…”
Section: In Situ Xas and Xrdmentioning
confidence: 99%