1968
DOI: 10.1107/s0567739468000550
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X-ray scattering factors computed from numerical Hartree–Fock wave functions

Abstract: This report was prepared as an account of Government sponsored work. Neither the United States, nor the Commission, nor any person acting on behalf of the Commission: A. Makes any warranty or representation, expressed or implied, with respect to the accuracy, completaness, or urrefuh?ess of the information colltained in this report, or that the m e of any information, appnratua, method, or process disclosed in this report m y not infringe priwtely owned rlghb; or B. Assumes any liabilities with respect to the … Show more

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Cited by 4,825 publications
(1,970 citation statements)
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“…The Patterson method [14] confirmed the proposed coordinates. The positional and thermal displacement parameters (anisotropic except for sulfur in Pbl/3TaS2) were refined on Fo with full-matrix least-squares procedures (CRYLSQ [15]) minimizing the function Q = ~h [w(IFol-k]Fcl)2]" Neutral atom scattering factors [16] were used and anomalous dispersion factors [17] were included in Pc. Among the low-angle reflections, no corrections for secondary extinction was necessary.…”
Section: Structure Determinationmentioning
confidence: 99%
“…The Patterson method [14] confirmed the proposed coordinates. The positional and thermal displacement parameters (anisotropic except for sulfur in Pbl/3TaS2) were refined on Fo with full-matrix least-squares procedures (CRYLSQ [15]) minimizing the function Q = ~h [w(IFol-k]Fcl)2]" Neutral atom scattering factors [16] were used and anomalous dispersion factors [17] were included in Pc. Among the low-angle reflections, no corrections for secondary extinction was necessary.…”
Section: Structure Determinationmentioning
confidence: 99%
“…[14] The values of f (q z , E) are automatically loaded and calculated from the according parameter files by the udkm1Dsim toolbox for each atom/ion for a given E and q z and the reader may refer to the documentation of the atomBase class for further details. In order to account for the polarization of the Xrays one has to introduce a θ-dependent polarization factor P (θ) in kinematical and dynamical XRD calculations given by: [8] …”
Section: X-ray Diffractionmentioning
confidence: 99%
“…a cryostat for low temperature work, or high field work, or a pressure cell) are included in the present design: some sample stages can accept a load up to ϳ200 kg, and the clearance at the sample can be Table 2 Parameters for Si back-reflections near room temperature. Note that this has been calculated based on [34,35] using code based on [36]. However, the form factors in [34] extend only to momentum transfers Ͻ19 Å Ϫ1 so these values are extrapolated.…”
Section: Inelastic X-ray Scatteringmentioning
confidence: 99%