1999
DOI: 10.1007/bfb0112834
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X-Ray Scattering from Soft-Matter Thin Films

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Cited by 478 publications
(388 citation statements)
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“…In standard procedure (see, for example Ref. [18]) the interfacial structure is divided into N layers. Each layer has a thickness l j and electron density j ρ .…”
Section: Electron-density Profilementioning
confidence: 99%
“…In standard procedure (see, for example Ref. [18]) the interfacial structure is divided into N layers. Each layer has a thickness l j and electron density j ρ .…”
Section: Electron-density Profilementioning
confidence: 99%
“…The oscillation period ΔP appears to decrease with increasing concentration of the aqueous solution. As the thickness d is proportional to the reciprocal of ΔP [21], this result implies that …”
Section: Estimation Of Film Thickness Of Spun-filmsmentioning
confidence: 94%
“…Specular X-ray reflectivity (XRR) is a unique and powerful analytical method (Figure 2) that is frequently applied to condensed soft-matter films, including glass transition studies of ultrathin polymer films [16][17][18][19][20], but which has not been applied in amorphous sugar studies. XRR can evaluate the layered structure of a material, such as the film thickness, electron density, surface roughness, and interfacial width [21,22]. When the incident X-ray angle in the 2θ/ω scan exceeds the total reflection critical angle (θ C ), some of the X-rays penetrate the first layer, while the others reflect from the first-layer surface (Figure 2a).…”
Section: Introductionmentioning
confidence: 99%
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“…X-ray reflectivity is extremely sensitive to the layered structure along the depth of the film on the angstrom to nanometer scale. 23,24 As a result, one can study the thermoresponsive behavior of a PNIPAM solid ultrathin film by measuring the thickness during heating and cooling. This experiment shows that the PNIPAM solid ultrathin film changes thickness from 190 to 203 ¡ in response to heating and cooling, even without any direct contact with bulk water.…”
mentioning
confidence: 99%