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REPORT DATE 3. REPORT TYPE AND DATES COVEREDFinal -15 December 1996 -14 December 2000
TITLE AND SUBTITLE
Fundamentals of Metal Film Deposition with Hyperthermal Ions
AUTHOR(S)Dr. Barbara H. Cooper
PERFORMING ORGANIZATION NAME(S) AND ADDRESS(ES)Cornell University Ithaca, NY 14853 14 December 00 can be summarized in five key areas. They are:
SPONSORING/MONITORING AGENCY NAWIE(S) AND ADDRESS(ES)AFOSR
ABSTRACT (Maximum 200 words)Our accomplishments for the period of 15 December 97 A. Morphology evolution of ion-irradiated Au(lll); B. Thermal relaxation of a sputter-roughened surface; C. Energetic deposition of Cu on Cu(l 11); D. Monte Carlo and Molecular Dynamics simulations of mound formation, thermal relaxation, and energetic deposition; and E. Hardware development for studies of energetic deposition with controlled energy beams.
PROJECT TITLE: FUNDAMENTALS OF METAL THIN FILM DEPOSITION AND SURFACE PROCESSING WITH HYPERTHERMAL IONS
1) OBJECTIVESOur objectives are to understand the microscopic processes that occur during thin film growth and surface processing with energetic beams, and to determine how and why the use of energetic beams influences macroscopic film and surface properties. Technologically important growth techniques (e.g., sputter and plasma deposition, ionassisted deposition, pulsed laser deposition) employ hyperthermal energy (a few eV to several hundred eV) particles, resulting in lower growth temperatures and films with substantially different properties than thermally deposited films [1]. These differences result in part from the highly non-equilibrium atomic motions that can occur when energy is transferred to the surface atoms by the collisions of the hyperthermal incident particles [2]. In addition, the hyperthermal beams used routinely in surface processing techniques, such as sputter cleaning, patterning, and depth profiling, can give rise to a variety of surface morphologies [3]. It is thus desirable to gain a better understanding of the microscopic processes that occur during energetic beam thin film growth and surface processing and how they influence surface properties.We are using the complementary techniques of real-time X-ray diffraction and Scanning Tunneling Microscopy (STM) to study surface morphology evolution during growth and sputtering with energetic beams. The combined use of X-rays and STM provides a more complete picture than either technique alone. X-rays measure the long range and average properties of the surface, and are ideally suited to real-time observations. STM provides real-space measurem...