X-ray standing waves: a method for thin layered systems

Krämer, M.; Bohlen, Alex von; Sternemann, Christian; Paulus, Michael; Hergenröder, Roland

doi:10.1039/b607252f

Cited by 33 publications

(19 citation statements)

References 32 publications

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“…The dependence of the primary intensity on the glancing angle and the height in accord with Equations 2.14 and 2.17 can be demonstrated as a threedimensional graph I int (α,z)/I 0 after Krämer et al [10][11][12]. Both functions of intensity 2.14 and 2.17 coincide at the surface of the substrate, that is, for z = 0.…”

Section: Standing Waves In Front Of a Thick Substratementioning

confidence: 83%

Principles of Total Reflection XRF

2014

Total‐Reflection X‐Ray Fluorescence Analysis and Related Methods

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Section: Standing Waves In Front Of a Thick Substratementioning

confidence: 83%

Principles of Total Reflection XRF

2014

Total‐Reflection X‐Ray Fluorescence Analysis and Related Methods

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“…The intensity distribution inside the XSW strongly depends on the incident angle. Thus, angular variation of the emitted fluorescence lines reveals information about the vertical distribution of the element of interest [34,35,36].…”

Section: Txrf Calibration Samplesmentioning

confidence: 99%

Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy

Hönicke

Krämer

Lühl

et al. 2018

Spectrochimica Acta Part B: Atomic Spectroscopy

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With the advent of both modern X-ray fluorescence (XRF) methods and improved analytical reliability requirements the demand for suitable reference samples has increased. Especially in nanotechnology with the very low areal mass depositions, quantification becomes considerably more difficult. However, the availability of suited reference samples is drastically lower than the demand. Physical vapor deposition (PVD) techniques have been enhanced significantly in the last decade driven by the need for extremely precise film parameters in multilayer production. We have applied those techniques for the development of layer-like reference samples with mass depositions in the ng-range and well below. Several types of reference samples were fabricated: multi-elemental layer and extremely low (sub-monolayer) samples for various applications in XRF and total-reflection XRF (TXRF) analysis. Those samples were characterized and compared at three different synchrotron radiation beamlines at the BESSY II electron storage ring employing the reference-free XRF approach based on physically calibrated instrumentation. In addition, the homogeneity of the multi-elemental coatings was checked at the P04 beamline at DESY. The measurements demonstrate the high precision achieved in the manufacturing process as well as the versatility of application fields for the presented reference samples.

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“…Adapted from [30]. a handful of studies report on the localization of such light elements by XSW fluorescence [62,66,67]. For example, Zheludeva et al determined the distribution of phosphorus in a relatively thick (N100 nm) protein/ phospholipid film at an air/water interface [67].…”

Section: Light Elements At Soft Interfacesmentioning

confidence: 99%

Structural characterization of soft interfaces by standing-wave fluorescence with X-rays and neutrons

Schneck

Demé

2015

Current Opinion in Colloid & Interface Science

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We present a review of standing-wave fluorescence techniques with x-rays and neutrons for the elementspecific structural investigation of interfaces. The basic principles are introduced and typical measurement configurations with their advantages and limitations are compared. An overview of studies dealing with various types of interfaces is given. In particular, work on soft and biological matter in planar, interfacial geometries is discussed.

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X-ray standing waves: a method for thin layered systems

Cited by 33 publications

References 32 publications

Principles of Total Reflection XRF

Principles of Total Reflection XRF

Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy

Structural characterization of soft interfaces by standing-wave fluorescence with X-rays and neutrons

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