1988
DOI: 10.1002/pssa.2211060105
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X-ray standing waves under the conditions of multiple diffraction

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Cited by 39 publications
(9 citation statements)
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“…This expression is similar to (77) obtained for the SR yield with the small depth of yield. This approach was for the first time applied for the measurement of the phase of the structure factor in perfect crystals in [101] and then generalized for the case of deformed crystals theoretically [122,127] and experimentally [128]. Approach described in this review paper to the calculation and analysis of the secondary radiation yield while the dynamical diffraction of x-rays was quite general.…”
Section: Discussionmentioning
confidence: 99%
“…This expression is similar to (77) obtained for the SR yield with the small depth of yield. This approach was for the first time applied for the measurement of the phase of the structure factor in perfect crystals in [101] and then generalized for the case of deformed crystals theoretically [122,127] and experimentally [128]. Approach described in this review paper to the calculation and analysis of the secondary radiation yield while the dynamical diffraction of x-rays was quite general.…”
Section: Discussionmentioning
confidence: 99%
“…This additional peak is generated by both the incident beam and strongly reflected beam and has an asymmetric shape owing to the change of the phase difference between the complex amplitudes of the incident and strongly reflected beams. Such a shape is characteristic of the curve of the yield of secondary radiation in the standing-wave technique (Kovalchuk & Kohn, 1986a,b) and was described for the first time by Kohn (1988b). Experimental setup.…”
Section: Experiments and Fitmentioning
confidence: 97%
“…Another interesting development is due to Kohn and coworkers who used three-beam diffraction concepts to obtain a depth pro®le of crystal distortion (Kohn, 1988;Kohn & Samoilova, 1992). This has been further extended by Schroer (1998), who, by numerical simulations, included effects of strain owing to multilayer deposition.…”
Section: Introductionmentioning
confidence: 99%