2014
DOI: 10.1093/jmicro/dfu045
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X-ray STM: Nanoscale elemental analysis & Observation of atomic track

Abstract: Scanning tunneling microscopy (STM) combined with brilliant X-rays from synchrotron radiation (SR) can provide various possibilities of original and important applications, such as the elemental analysis on solid surfaces at an atomic scale. The principle of the elemental analysis is based on the inner-shell excitation of an element-specific energy level "under STM observation". A key to obtain an atomic locality is to extract the element-specific modulation of the local tunneling current (not emission that ca… Show more

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Cited by 2 publications
(1 citation statement)
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“…We ultimately achieved a spatial resolution of several tens of nanometers, despite the beam size being several millimeters, by irradiating the STM tip and the sample surface with synchrotron radiation and by obtaining images at photon energies close to light absorption edges of a target element on the surface. This technique was also developed at SPring-8 [61] and the Advanced Photon Source (APS) in the US [62]. Currently, this technique can attain a spatial resolution of several nanometers.…”
Section: E Development Of Techniques Combined With Microscopymentioning
confidence: 99%
“…We ultimately achieved a spatial resolution of several tens of nanometers, despite the beam size being several millimeters, by irradiating the STM tip and the sample surface with synchrotron radiation and by obtaining images at photon energies close to light absorption edges of a target element on the surface. This technique was also developed at SPring-8 [61] and the Advanced Photon Source (APS) in the US [62]. Currently, this technique can attain a spatial resolution of several nanometers.…”
Section: E Development Of Techniques Combined With Microscopymentioning
confidence: 99%