X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Malinowska, A.; Lefeld‐Sosnowska, M.; Wieteska, K.; Wierzchowski, W.; Graeff, W.; Pajączkowska, A.

doi:10.1016/j.jcrysgro.2008.04.034

Cited by 4 publications

(5 citation statements)

References 15 publications

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“…1a). The same result was observed for another samples studied earlier [8][9][10][11][12][13][14][15]. In the outer part of these crystals a lot of linear black diffraction contrasts and volume defects contrasts of irregular shapes were observed.…”

Section: Resultssupporting

confidence: 85%

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Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO₄

et al. 2008

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SrLaGaO 4 single crystals are perspective substrate materials for high temperature superconductors thin films, elements of thermal radiation receivers and other electronic devices. The defect structure of the Czochralski grown SrLaGaO 4 crystal was investigated by means of X-ray topography exploring both conventional and synchrotron sources. The crystal lattice defects in the core region of the crystal were investigated. The regular network of defects arranged in rows only in 100 direction was observed. Owing to high resolution of synchrotron radiation white beam back reflection topographs one can distinguish individual spots forming the lines of the rows. It can be supposed that these elongated rod-like volume defects are located in {100} lattice planes forming a kind of walls. They are built approximately of the same phase as crystal but crystallize at a different moment than a rest of the crystal due to the constitutional supercooling.

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Section: Resultssupporting

confidence: 85%

“…The results of our previous studies concerning SLG crystals were shown in Refs. [8][9][10][11][12][13][14][15].…”

Section: Introductionmentioning

confidence: 99%

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO₄

et al. 2008

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“…The synchrotron investigation can reveal signicant strains associated with the segregation fringes [42]. In particular they can be revealed in transmission and reection section topography, similarly as it was discussed in [47].…”

Section: Revealing Of the Segregation Fringes And Defects Related To mentioning

confidence: 65%

“…Synchrotron radiation white beam back reection projection topograph in 134 reection, λ = 0.094 nm; E denotes boundary between two slightly misoriented regions and G, H defect groups with two kinds of diraction contrasts. According to A. Malinowska et al[42].partly related with growth striations. The zebra pattern (Fig.…”

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confidence: 99%

Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method

et al. 2013

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The synchrotron diraction topography had been widely used for investigation of the structural defects in crystals grown by the Czochralski method. Similarly as conventional diraction topography, the synchrotron topography consists in recording with high spatial resolution of the beam formed by the Bragg reection from the crystal. The advantages of synchrotron sources come from the possibilities of using the wavelength from a wide spectral range, improved high spatial resolution and collimation of the beam as well as from shortening the time necessary for the investigation. The synchrotron diraction topography includes experimentally simpler white beam topography and more complicated monochromatic beam (multicrystal) topography, where the beam is formed by monochromators. In the case of Czochralski-grown crystals the synchrotron diraction topography can be used for studying of the individual dislocations and their complexes such as glide bands or sub-grain boundaries, individual blocks, twinning, the domain structure and various segregation eects negatively aecting crystal properties. In addition, the topographical investigation can provide information concerning the reasons for the generation of defects, useful in the improving of the technology. In the present paper the possibilities of the synchrotron diraction topography are discussed on the basis of several investigations of the Czochralski-grown oxide and semiconductor crystals, performed by the authors at HASYLAB. The majority of the results concern the oxide crystals grown at the Institute of Electronic Materials Technology, in particular garnets, orthovanadates, mixed calcium barium and strontium niobates as well as praseodymium lanthanum aluminates.

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“…Density of the fringes are dierent in both crystals. Detailed studies of the lattice deformation associated with the segregation fringes were performed by means of synchrotron topography and is presented in [33,36]. (010) and (011) lattice planes with the sample surface.…”

Section: The Czochralski Grown Oxide Materialsmentioning

confidence: 99%

X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

Lefeld‐Sosnowska

Malinowska

2013

Acta Phys. Pol. A

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X-ray diraction topography is one of basic diagnostics tools serving for visualisation of single crystal lattice defects. Defects of various kinds can be observed. The present study is a review of topographic results obtained in the X-ray laboratory of the Institute of Experimental Physics, University of Warsaw, for three families of single crystals grown by the Czochralski method: (i) silicon (Si) and Si1−xGex, (ii) selected binary REVO4 oxides and (iii) selected ternary ABCO4 oxides. The eect of chemical composition, growth conditions and post growth thermal annealing on the defect appearing in crystals is discussed. Various defects are revealed: the growth dislocations (some early Si crystals), the composition-gradient-induced lattice deformation (Si1−xGex, solid solutions CaxSr1−xNdAlO4), defects generated in Si after the post growth thermal processes, oriented elongated rod-like macro-defects tending to form networks within the crystal core, cellular structure in the outer shell (SrLaGaO4), and variously developed block structure (in selected binary REVO4 crystals).

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X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Cited by 4 publications

References 15 publications

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO₄

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO₄

Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method

X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

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X-ray topography of Ca0.5Sr0.5NdAlO4 single crystal

Cited by 4 publications

References 15 publications

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO4

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO4

Synchrotron Diffraction topography in Studying of the Defect Structure in Crystals Grown by the Czochralski Method

X-ray Diffraction Topography - Investigation of Single Crystals Grown by the Czochralski Method

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Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO₄

Conventional and Synchrotron X-Ray Topography of Defects in the Core Region of SrLaGaO₄