1998
DOI: 10.1023/a:1019169019617
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Cited by 67 publications
(42 citation statements)
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“…Any degree of static friction will then require a finite shear deformation before any relative sliding resumes [20]. Friction and shear deformation are in fact closely related on the length scales considered here [21]. Figure 4 is a schematic of a simple dynamic model of IC AFM designed to explain the essential characteristics of our results.…”
mentioning
confidence: 89%
“…Any degree of static friction will then require a finite shear deformation before any relative sliding resumes [20]. Friction and shear deformation are in fact closely related on the length scales considered here [21]. Figure 4 is a schematic of a simple dynamic model of IC AFM designed to explain the essential characteristics of our results.…”
mentioning
confidence: 89%
“…Among the more common test geometries are the peel test, [4][5][6] the spherical ͑Johnson-Kendall-Roberts, or JKR͒ or flat ͑probe tack͒ techniques, [7][8][9][10] and nanoprobe techniques ͓atomic force microscopy ͑AFM͒, nanoidentation͔. 11,12 Illustrative schematics of the peel test and two of the probe geometries are shown in Fig. 1.…”
Section: Introductionmentioning
confidence: 99%
“…This delayed maximum seems to be a characteristic of viscoelastic materials and was not observed for any of the elastic materials we have also studied; e.g., diamond, mica, silicone [27].…”
Section: Sms Measurements On a Viscoelastic Materialsmentioning
confidence: 64%