2009
DOI: 10.1016/j.physb.2009.08.209
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XAFS studies of nickel-doped lead telluride

Abstract: a b s t r a c tThe problem of impurities and defect states in lead telluride-based semiconductors is of crucial importance for their practical applications. X-ray absorption fine structure (XAFS) techniques are capable to address some of the key issues regarding impurities position, their valent state, as well as the local structural changes of the host lattice in the immediate surrounding of the impurity atoms. In this paper we present the results of the Ni K-absorption edge XAFS studies of Ni-doped PbTe at d… Show more

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Cited by 10 publications
(2 citation statements)
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“…The range of the EXAFS can be extended nearly few hundred eV beyond the absorption edge and thus can bestow information regarding the structure of the material, that is, the nature and number of atoms in the adjacent vicinity of the scattering atom and the parameters due to the disorder which comprises of the Debye–Waller factor of EXAFS. This parameter is useful for the computation of the Grüneisen parameter. …”
Section: Resultsmentioning
confidence: 99%
“…The range of the EXAFS can be extended nearly few hundred eV beyond the absorption edge and thus can bestow information regarding the structure of the material, that is, the nature and number of atoms in the adjacent vicinity of the scattering atom and the parameters due to the disorder which comprises of the Debye–Waller factor of EXAFS. This parameter is useful for the computation of the Grüneisen parameter. …”
Section: Resultsmentioning
confidence: 99%
“…This change of the Yb valence state is ascribed to change of the f-shell occupancy, from 14 electrons in Yb 2+ to 13 electrons in Yb 3+ state (4f 13 5d 1 6s 2 ), and is accompanied with charge redistribution in the local surrounding of the impurity atom. A significant distortion of the host structure around impurities was already observed in numerous PbTe-based compounds [11,12].…”
Section: Introductionmentioning
confidence: 83%