2021
DOI: 10.3390/cryst11050546
|View full text |Cite
|
Sign up to set email alerts
|

Xenon Plasma Focused Ion Beam Milling for Obtaining Soft X-ray Transparent Samples

Abstract: We employ xenon (Xe) plasma focused ion beam (PFIB) milling to obtain soft X-ray transparent windows out of bulk samples. The use of a Xe PFIB allows for the milling of thin windows (several 100 nm thick) with areas of the order of 100 µm × 100 µm into bulk substrates. In addition, we present an approach to empirically determine the transmission level of such windows during fabrication by correlating their electron and soft X-ray transparencies. We perform scanning transmission X-ray microscopy (STXM) imaging … Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2022
2022
2024
2024

Publication Types

Select...
2
1

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 23 publications
0
3
0
Order By: Relevance
“…The structural integrity of a free-standing crystalline membrane during KOH etching is still to be investigated. An alternative to KOH etching would be FIB milling [ 38 ] or RIE [ 39 ].…”
Section: Discussionmentioning
confidence: 99%
“…The structural integrity of a free-standing crystalline membrane during KOH etching is still to be investigated. An alternative to KOH etching would be FIB milling [ 38 ] or RIE [ 39 ].…”
Section: Discussionmentioning
confidence: 99%
“…However, recent developments in focused-ion-beam lithography enabled the fabrication of thin (<100 nm) membranes from single-crystalline substrates such as SrTiO 3 and Gd 3 Ga 5 O 12 , opening the possibility to study epitaxial materials, e.g. multiferroic perovskites, magnetic garnets) with transmission x-ray microscopy (TXM) techniques [305].…”
Section: Current and Future Use Of The Technique For Materials Sciencementioning
confidence: 99%
“…The atomic selectivity in resonant imaging is an additional asset to understand how dynamics relates to function in these compounds. Many of these systems are grown epitaxially on single-crystalline substrates, and we note that significant progress has been made in locally thinning such samples to soft x-ray transparency [305,363].…”
Section: Current and Future Use Of The Technique For Materials Sciencementioning
confidence: 99%