XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data

Tamura, Nobumichi

doi:10.1142/9781908979636_0004

Cited by 102 publications

(121 citation statements)

References 38 publications

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“…The actual temperature on the silicon substrate was systematically calibrated with a thermocouple. The collected Laue diffraction patterns were analyzed to obtain information of crystal phase, orientation and lattice parameter, using the XMAS software package on a supercomputer at NERSC (National Energy Research Scientific Computing Center) [26].…”

Section: Materials Preparation and Characteristicsmentioning

confidence: 99%

In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

Zeng

Tamura

et al. 2017

Acta Materialia

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Shape memory effect (SME) High temperature deformation High temperature shape memory ceramics a b s t r a c t Recently, the shape memory effect with significant recoverable shape deformation has been discovered in small volume single-crystal zirconia. The application potential for such shape memory ceramics has spurred in-depth exploration of the martensitic transformation crystallography and high temperature shape memory effect. In this work, the martensitic transformation of micron-sized zirconia has been studied in both a pristine as-produced condition and after micromechanical compression, using synchrotron scanning micro X-ray diffraction (mXRD). The pristine zirconia was found to transform into the monoclinic phase via a different crystallographic path than the compressed zirconia, resulting in distinct monoclinic variant preferences. The characteristic martensitic transformation temperatures were also found to be higher after uniaxial compression than in the pristine condition. Such observations provide insight on the differences between stress-induced and thermally-induced martensitic transformation. Moreover, we have observed a full cycle of the shape memory effect with large recoverable strain (7%) in micron-sized zirconia at a temperature of 400 C. Our findings provide an important guideline to tailor the high-temperature shape memory properties of zirconia for further scientific research and engineering applications.

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Section: Materials Preparation and Characteristicsmentioning

confidence: 99%

In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

Zeng

Tamura

et al. 2017

Acta Materialia

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“…dimensions and orientation refinement) were described in Tamura (2014) and Robach (2017), and also in the documentation of the LaueTools software.…”

Section: Appendix a -X-ray Laue Microdiffraction : Methods And Parametmentioning

confidence: 99%

“…Automated analysis of Laue patterns comprises different stages that were described in Tamura (2014) for XMAS software and Robach (2017) for LaueTools software (Micha et al, http://sourceforge.net/projects/lauetools/). Here LaueTools software was used for the Laue pattern indexation, determination of the crystal Euler angles (orientation) and the distorsion of the quartz unit cell (elastic strain, obtained by comparing the experimental and the undeformed unit cell).…”

Section: Laue X-ray Microdiffractionmentioning

confidence: 99%

High stresses stored in fault zones: example of the Nojima fault (Japan)

Boullier¹,

Robach²,

Ildefonse³

et al. 2017

Preprint

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Abstract. During the last decade pulverized rocks have been described on outcrops along large active faults and attributed to damage related to a propagating seismic rupture front. Questions remain on the maximal lateral distance from the fault plane and maximal depth for dynamic damage to be imprinted in rocks. In order to document these questions, a core sample of granodiorite located at 51.3 m from the Nojima fault (Japan) that was drilled after the Hyogo-ken Nanbu (Kobe) earthquake is studied by using Electron Back-Scattered Diffraction (EBSD) and high resolution X-ray Laue 15 microdiffraction. Although located outside of the Nojima damage fault zone and macroscopically undeformed, the sample shows pervasive microfractures and local fragmentation that are attributed to the first stage of seismic activity along the Nojima fault characterized by laumontite as the main sealing mineral. EBSD mapping was used in order to characterize the crystallographic orientation and deformation microstructures in the sample, and X-ray microdiffraction to measure elastic strain and residual stresses in a quartz grain. Both methods give consistent results on the crystallographic orientation and 20show small and short wave-length misorientations associated with laumontite-sealed microfractures and alignments of tiny fluid inclusions. Deformation microstructures in quartz are symptomatic of the semi-brittle faulting regime, in which low temperature brittle, plastic deformation and stress-driven dissolution-deposition processes occur conjointly.Residual stresses are calculated from elastic strain measured by X-ray Laue microdiffraction and stress peaks at 100 MPa (mean 141 MPa). Such stress values are comparable to the peak strength of a damaged granodiorite from the damage zone 25 of the Nojima fault indicating that, although apparently macroscopically undeformed, the sample is actually highly damaged. The homogeneously distributed microfracturing of quartz is the microscopically visible imprint of this damage and suggests that high stresses were stored in the whole sample and not only concentrated on some crystal defects. It is proposed that the high residual stresses are the sum of the stress fields associated with individual dislocations, dislocation microstructures and originated from the dynamic damage related to the propagation of rupture fronts or seismic waves 30 associated to M6 to M7 earthquakes during Paleocene on the Nojima fault at a 3.7 -11.1 km depth (laumontite stability domain) where confining pressure prevented pulverization. The high residual stresses and the deformation microstructures Solid Earth Discuss., https://doi

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“…Fig. 3 shows the typical Laue diffraction pattern for silicon being indexed manually using XMAS software [25] to identify the miller indices of the planes that produce the diffraction spots within the pattern. This indexed pattern can then be used to index the remaining diffraction patterns automatically by XMAS.…”

Section: Va Handara Et Al Solar Energy Materials and Solar Cells 162mentioning

confidence: 99%

“…The XMAS software was equipped with a specialized algorithm called "Adaptive Indexing" [25] to overcome such circumstances. Weak silicon diffraction peaks can be detected and indexed by the adaptive indexing by digitally removing all the peaks indexed as copper and from the remaining, XMAS will index as silicon peaks.…”

Section: Va Handara Et Al Solar Energy Materials and Solar Cells 162mentioning

confidence: 99%

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

Handara

Radchenko

Tippabhotla

et al. 2017

Solar Energy Materials and Solar Cells

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A B S T R A C TThin ( < 150 µm) silicon solar cell technology is attractive due to the significant cost reduction associated with it. Consequently, fracture mechanisms in the thin silicon solar cells during soldering and lamination need to be fully understood quantitatively in order to enable photovoltaics (PV) systems implementation in both manufacturing and field operations. Synchrotron X-ray Microdiffraction (µSXRD) has proven to be a very effective means to quantitatively probe the mechanical stress which is the driving force of the fracture mechanisms (initiation, propagation, and propensity) in the thin silicon solar cells, especially when they are already encapsulated. In this article, we present the first ever stress examination in encapsulated thin silicon solar cells and show how nominally the same silicon solar cells encapsulated by different polymer encapsulants could have very different residual stresses after the lamination process. It is then not difficult to see how the earlier observation, as reported by Sander et al. (2013) [1], of very different fracture rates within the same silicon solar cells encapsulated by different Ethylene Vinyl Acetate (EVA) materials could come about. The complete second degree tensor components of the residual stress of the silicon solar cells after lamination process are also reported in this paper signifying the full and unique capabilities of the Synchrotron X-Ray Microdiffraction technique not only for measuring residual stress but also for measuring other potential mechanical damage within thin silicon solar cells.

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XMAS: A Versatile Tool for Analyzing Synchrotron X-ray Microdiffraction Data

Cited by 102 publications

References 38 publications

In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

High stresses stored in fault zones: example of the Nojima fault (Japan)

Probing stress and fracture mechanism in encapsulated thin silicon solar cells by synchrotron X-ray microdiffraction

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