2020
DOI: 10.1016/j.elspec.2020.146970
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XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

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Cited by 34 publications
(18 citation statements)
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“…The passive film thickness of untested 316L was 1.87 nm, which is in agreement with the results obtained from other authors [41][42][43]. Thicker passive film thickness outside the wear track was observed for all stainless steel tested with WG with respect to the reference sample, however, in the case of PAO thicker passive film was only observed using C12 as additive.…”
Section: Passive Film Thickness and Surface Chemical Compositionsupporting
confidence: 91%
“…The passive film thickness of untested 316L was 1.87 nm, which is in agreement with the results obtained from other authors [41][42][43]. Thicker passive film thickness outside the wear track was observed for all stainless steel tested with WG with respect to the reference sample, however, in the case of PAO thicker passive film was only observed using C12 as additive.…”
Section: Passive Film Thickness and Surface Chemical Compositionsupporting
confidence: 91%
“…Observation of hydroxides resulted from the exposure of steel to moisture as given by 36 where M denotes Fe or Cr. The Fe(OH) 3 peaks are proposed to be not observed in the untreated steel due to Fe(OH) 3 was less stable than Cr(OH) 3 when the uncarburized steel exposed to air 37 . The peak observed at ~ 532.6 eV (O 1s) contributed by M(OH) 3 is therefore proposed to be of Cr(OH) 3 located at the outermost surface of untreated steel.…”
Section: Resultsmentioning
confidence: 99%
“…[8][9] At present, many analytical techniques including secondary ion mass spectrometry (SIMS), X-ray photoelectron spectroscopy (XPS), laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS), and auger electron spectroscopy (AES) have been used for surface analysis and depth profile analysis. [10][11][12][13][14][15][16] Noë l et al 14 analyzed the depth profile of inorganic electrodes and organic layers in organic light-emitting diode stacks by TOF-SIMS. Oswald et al 15 used XPS to investigate the depth distribution of Ti/Al multilayers and Ti-Al alloy layers.…”
Section: Introductionmentioning
confidence: 99%
“…Oswald et al 15 used XPS to investigate the depth distribution of Ti/Al multilayers and Ti-Al alloy layers. Detriche et al 16 reported a fast approach with XPS depth profile analysis for gaining elemental distribution of the oxide layer on metal surfaces. Although these techniques are used in the depth analysis of layer materials, there are still the challenges of obtaining accurate concentration or distribution information of the elements in the depth direction without standard reference materials.…”
Section: Introductionmentioning
confidence: 99%