XPS studies of charging effect induced by X-ray irradiation on amorphous SiO<sub>2</sub> thin films

Xing, Dai Peng; Zeng, Hui; Zhang, Wen Xu; Zhang, Wan Li

doi:10.1088/1757-899x/490/2/022079

Cited by 14 publications

(3 citation statements)

References 7 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…It can be seen that for Si 2p and O 1s spectra, only one symmetric peak can be fitted, which is located at the binding energies of 103.5 and 532.83 eV, respectively. These two binding energies correspond to Si 4+ and O 2− in SiO 2 , 23,24 indicating that the film is completely oxidized to stoichiometric SiO 2 . Figure 1d,e shows microstructures of the SiO 2 film deposited on silicon wafers characterized by SEM and AFM.…”

Section: ■ Results and Discussionmentioning

confidence: 99%

SiO₂: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

Liu

Wei

2023

ACS Sustainable Chem. Eng.

View full text Add to dashboard Cite

For the practical application of electrochromic devices (ECDs), the development and preparation of high-performance electrolyte materials is one of the urgent problems to be solved. In this work, an allsolid-state ECD with the integrated structure of glass/ITO/WO 3 /Li/SiO 2 / NiO/ITO has been prepared by the magnetron sputtering method. The amorphous SiO 2 film prepared by pulsed direct current reactive magnetron sputtering was used as the electrolyte layer in the ECD for the first time and shows promising potential due to its ultrahigh transparency, good intrinsic electronic insulation, and loose structure for fast ion conduction. The ECD exhibits low leakage current density (8.5 μA cm −2 for bleaching and 43.4 μA cm −2 for coloring), high optical modulation (ΔT = 71.9% at 707 nm), fast response speed (1.1 s for the bleaching process and 8.5 s for the coloring process), excellent cycle stability, and high coloration efficiency (126.4 cm 2 C −1 ). This work not only indicates that SiO 2 as a dielectric material can be used as the electrolyte layer in all-solid-state ECDs but also provides new avenues in the selection of electrolyte materials for the preparation of high-performance ECDs.

show abstract

Section: ■ Results and Discussionmentioning

confidence: 99%

SiO₂: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

Liu

Wei

2023

ACS Sustainable Chem. Eng.

View full text Add to dashboard Cite

show abstract

“…Figure shows the F 1s, O 1s, and C 1s XPS spectra of cycled cast-PEO and cycled dry-PEO. It is worth noting that the binding energies between cycled cast-PEO and cycled dry-PEO exhibit shifts up to 1.8 eV for specific species, which could be attributed to differing charging effects due to the differing electronically insulating properties of PEO and the formed SEI species. − …”

Section: Results and Discussionmentioning

confidence: 99%

Capacity Degradation of Zero-Excess All-Solid-State Li Metal Batteries Using a Poly(ethylene oxide) Based Solid Electrolyte

Müller,

Szczuka,

Tsai

et al. 2024

ACS Appl. Mater. Interfaces

View full text Add to dashboard Cite

“…The in-plane area of defects has been estimated using the software for image analysis Gwydion [30] in the three cases. The in-plane defects of the a-SiH NoIr have an area density of about 2%, after irradiation, the area of defects results increased to about 12%, while after annealing it is reduced to 6%.…”

Section: Effect Of Irradiation On the Sio 2 Coatingmentioning

confidence: 99%

High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices

et al. 2022

View full text Add to dashboard Cite

In this paper, by means of high-resolution photoemission, soft X-ray absorption and atomic force microscopy, we investigate, for the first time, the mechanisms of damaging, induced by neutron source, and recovering (after annealing) of p-i-n detector devices based on hydrogenated amorphous silicon (a-Si:H). This investigation will be performed by mean of high-resolution photoemission, soft X-Ray absorption and atomic force microscopy. Due to dangling bonds, the amorphous silicon is a highly defective material. However, by hydrogenation it is possible to reduce the density of the defect by several orders of magnitude, using hydrogenation and this will allow its usage in radiation detector devices. The investigation of the damage induced by exposure to high energy irradiation and its microscopic origin is fundamental since the amount of defects determine the electronic properties of the a-Si:H. The comparison of the spectroscopic results on bare and irradiated samples shows an increased degree of disorder and a strong reduction of the Si-H bonds after irradiation. After annealing we observe a partial recovering of the Si-H bonds, reducing the disorder in the Si (possibly due to the lowering of the radiation-induced dangling bonds). Moreover, effects in the uppermost coating are also observed by spectroscopies.

show abstract

XPS studies of charging effect induced by X-ray irradiation on amorphous SiO₂ thin films

Cited by 14 publications

References 7 publications

SiO₂: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

SiO₂: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

Capacity Degradation of Zero-Excess All-Solid-State Li Metal Batteries Using a Poly(ethylene oxide) Based Solid Electrolyte

High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices

Contact Info

Product

Resources

About

XPS studies of charging effect induced by X-ray irradiation on amorphous SiO2 thin films

Cited by 14 publications

References 7 publications

SiO2: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

SiO2: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

Capacity Degradation of Zero-Excess All-Solid-State Li Metal Batteries Using a Poly(ethylene oxide) Based Solid Electrolyte

High-Resolution Photoemission Study of Neutron-Induced Defects in Amorphous Hydrogenated Silicon Devices

Contact Info

Product

Resources

About

XPS studies of charging effect induced by X-ray irradiation on amorphous SiO₂ thin films

SiO₂: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices

SiO₂: A Novel Electrolyte for High-Performance All-Solid-State Electrochromic Devices