1998
DOI: 10.1002/(sici)1096-9918(199812)26:13<1027::aid-sia452>3.0.co;2-9
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XPS studies of low-temperature plasma-produced graded oxide-silicate-silica layers on titanium

Abstract: A method has been developed to produce a silica coating bonded to an oxidized titanium substrate, graded in composition and structure through the surface layer, providing the base for deposition of bioactive glasses and hydroxyapatite. A low‐temperature air/water/tetraethoxysilane plasma coating method is reported. Characterization of the graded surface layer using XPS and SEM is compared with previously reported studies of similar layers on nickel substrates. Depth profiling and the modified Auger parameter w… Show more

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Cited by 9 publications
(11 citation statements)
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“…The elemental composition of these surfaces comprised approximately of 60 at.% oxygen, 10 at.% carbon and 30 at.% silicon (Fig. 7B), which is similar to previous reports obtained using this technique [810]. The oxygen/silicon ratio of 2.1±0.2 is close to 2.0 expected for silicon dioxide.…”
Section: Resultssupporting
confidence: 88%
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“…The elemental composition of these surfaces comprised approximately of 60 at.% oxygen, 10 at.% carbon and 30 at.% silicon (Fig. 7B), which is similar to previous reports obtained using this technique [810]. The oxygen/silicon ratio of 2.1±0.2 is close to 2.0 expected for silicon dioxide.…”
Section: Resultssupporting
confidence: 88%
“…Silica is grown on Ti from Si-O species, formed in the air/TEOS plasma, becoming embedded as silicate species in the plasma grown Ti oxide layer [8]. Interestingly, the water present in the air supply acts as a catalyst in the hydrolysis of TEOS through a possible hydrolysis reaction shown below: Sifalse(OC2H5false)4+4H2OSifalse(OHfalse)4+4CH3CH2OH…”
Section: Resultsmentioning
confidence: 99%
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“…5 shows the Si 2p XPS spectra of 1.5Si-HA, 4.0Si-HA and 5.0Si-HA before and after sintering, representing low, middle and high Si dopant content, respectively. The peaks at 100.8 and 101.2 eV were assigned to SiO 4 4− in the lattice of Si-HA or Si-α-TCP [34,35]. The peak at 102.1 eV was assigned to surface calcium silicate (sharing two oxygen atoms only) [36], which would remain undetected in the XRD analysis because of its small quantity.…”
Section: Ft-ir and Xps Analyses Of The As-prepared And Sintered Samplesmentioning
confidence: 99%