XRD contribution to the study of Cs-implanted cubic zirconia

He implantation in cubic zirconia: Deleterious effect of thermal annealing

“…In other words, a tensile strain is created along the normal to the crystal surface. This result is in agreement with previous investigations in YSZ irradiated under different conditions [19,20]. Moreover, the scattered intensity exhibits a fringe pattern, revealing the presence of a strain depth distribution.…”

“…This value is low as compared to that measured in e.g. SiC [22]), but is typical for YSZ, as already observed under other different irradiation conditions: 0.55% for 4 MeV Au [19] and 1.2% for 300 keV Cs [20]. Rocking-curves (x-scans) recorded on the virgin crystal and on the strained (e N $ 0.2%), thus damaged, part of the implanted sample are presented in the inset of Fig.…”

Radiation effects in carbides: TiC and ZrC versus SiC

“…The shape of the XRD curves for crystals irradiated above 2 Â 10 13 cm À2 is due to the scattering of the X-ray beam by the strained amorphous-crystalline interface at the backside of the irradiated layer [22]. This finding implies that an amorphous layer is formed at the fluence of 2.4 Â 10 14 cm À2 , consistently with RBS/C results and with data available in the literature [1,18].…”

“…The damage was evaluated by combining Rutherford backscattering and channeling spectrometry (RBS-C), X-ray diffraction (XRD) and Raman spectroscopy; the complementarity of these techniques has been demonstrated in several works [16][17][18].…”

A HRXRD and nano-indentation study on Ne-implanted 6H–SiC

“…1, the peak corresponding to the peak damage region (dpa peak) can be observed only in the specimen irradiated to the lowest ion fluence of 2 Â 10 14 ions/cm 2 , while tails of diffuse scattering were observed in the specimens irradiated to the higher ion fluences of 1.1 and 3.8 Â 10 15 ions/ cm 2 . The absence of diffraction peaks corresponding to the peak damaged region in these two specimens can be ascribed to the diffuse scattering from the highly defective region rather than the diffraction [8,13]. Strain can therefore not be estimated precisely in this case.…”