Yields and images of secondary ions from organic materials by different primary Bi ions in time‐of‐flight secondary ion mass spectrometry

Shishido, Rie; Fujii, Makiko; Seki, Toshio; Aoki, Takaaki; Matsuo, Jiro; Suzuki, Shigeru

doi:10.1002/rcm.7455

Cited by 9 publications

(6 citation statements)

References 15 publications

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“…When using ToF-SIMS, the signal from the OsO – species was too weak to be used for image acquisition (data not shown). This inconsistency might be explained due to the lower rate of fragmentation when using the Bi 3 + primary ions used in ToF-SIMS acquisition and thus the peak intensity was lower for the diatomic OsO – ion species. The fragmentation effect from use of the Cs + primary ion probe is more profound and therefore with NanoSIMS it is not possible to image osmium oxide ion species with 3 or more atoms, but the OsO – species gives a strong signal.…”

Section: Resultsmentioning

confidence: 99%

Multimodal Imaging of Chemically Fixed Cells in Preparation for NanoSIMS

et al. 2016

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In this work, we have employed time-of-flight secondary ion mass spectrometry (ToF-SIMS) to image chemically fixed adrenal cells prepared for transmission electron microscopy (TEM) and subsequent high-spatial-resolution NanoSIMS imaging. The sample fixation methodology preserves cell morphology, allows analysis in the ultrahigh vacuum environment, and reduces topographic artifacts, thus making these samples particularly favorable for ToF-SIMS analysis. ToF-SIMS imaging enables us to determine the chemistry and preservation capabilities of the chemical fixation as well as to locate specific ion species from OsO4. The OsO4 species have been localized in lysosomes of cortical cells, a type of adrenal cell present in the culture. NanoSIMS imaging of the (190)Os(16)O(-) ion species in cortical cells reveals the same localization as a wide range of OsO4 ions shown with ToF-SIMS. Even though we did not use during NanoSIMS imaging the exact OsxOy(-) ion species discovered with ToF-SIMS, ToF-SIMS allowed us to define the specific subcellular features in a high spatial resolution imaging mode. This study demonstrates the possibility for application of ToF-SIMS as a screening tool to optimize high-resolution imaging with NanoSIMS, which could replace TEM for localization in ultrahigh resolution imaging analyses.

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Section: Resultsmentioning

confidence: 99%

Multimodal Imaging of Chemically Fixed Cells in Preparation for NanoSIMS

et al. 2016

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“…The depth profiles of aluminum species were obtained using a bismuth cluster ion beam as a first ion source during cesium ion beam milling. Bismuth cluster ions are widely used for TOF-SIMS owing to its high secondary ion yields of macromolecules, 42) and Cs ions with a low energy are useful for molecular depth-profiling. 43,44) An area of 200 × 200 μm 2 was analyzed with bismuth cluster ion at a beam voltage of 25 kV and a beam current of 0.2 pA during etching of a larger area of 450 × 450 μm 2 by cesium ion beam milling at a beam voltage of 1 kV and a beam current of 40 nA (Fig.…”

Section: Time-of-flight Secondary Ion Mass Spectrometrymentioning

confidence: 99%

Depth profiles of aluminum component in sequential infiltration synthesis-treated electron beam resist films analyzed by time-of-flight secondary ion mass spectrometry

Ito¹,

Ozaki²,

Nakamura³

et al. 2020

Jpn. J. Appl. Phys.

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Sequential infiltration synthesis (SIS) is a promising method for organic-inorganic hybridization of organic polymer resist films in nanolithography. The understanding of the distribution of inorganic components in hybrid films is necessary for the practical use of SIS-treated resist films. In this study, we investigated the distribution of aluminum oxide in SIS-treated positive-tone electron beam resist films of poly(methyl methacrylate) and ZEP520A with thicknesses of 100, 40, and 20 nm by time-of-flight secondary ion mass spectrometry (TOF-SIMS). TOF-SIMS profiles revealed that the aluminum species of AlO − and AlO 2 − derived from aluminum oxide existed heterogeneously near the air/polymer surface, film inside, and polymer/substrate interface, and the distributions of respective species depended on film thickness. TOF-SIMS enabled the characterization of aluminum distribution in 20 nm thick resist films. It was suggested that the oxidation states of Al components were different between near the air/ polymer surface and near the polymer/substrate interface.

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“…[2][3][4][5][6][7] Among them, the Bi cluster ion beam, which is one of the most utilized primary sources of TOF-SIMS, is generated by field emission and achieves high convergent beam irradiations. [8][9][10][11] However, the detection limit of macromolecules obtained with Bi-cluster ions is generally lower than that achieved by large cluster ions such as C 60 + and Ar n + . 12 Matrix-enhanced SIMS (ME-SIMS) is a sensitivity enhancement method for large-molecular-weight compounds, and various matrices have already been developed in this regard.…”

Section: Introductionmentioning

confidence: 99%

“…In recent years, various cluster ion sources, such as Au n + , Bi n q + , C 60 + , and Ar n + , have been developed for TOF‐SIMS 2–7 . Among them, the Bi cluster ion beam, which is one of the most utilized primary sources of TOF‐SIMS, is generated by field emission and achieves high convergent beam irradiations 8–11 . However, the detection limit of macromolecules obtained with Bi‐cluster ions is generally lower than that achieved by large cluster ions such as C 60 + and Ar n + 12 …”

Section: Introductionmentioning

confidence: 99%

Matrix‐enhanced secondary ion mass spectrometry: Effects of aliphatic carboxylic acid matrices on the sensitivity enhancement of biological phospholipids

Shishido

2023

Surface & Interface Analysis

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Matrix‐enhanced secondary ion mass spectrometry (ME‐SIMS) is an effective pre‐treatment method for the sensitivity enhancement of large molecules. Recently, matrix‐assisted laser desorption/ionization (MALDI) matrices, which consist of aromatic acids with benzene rings, have been developed using this technique. However, there are several differences in the desorption and ionization processes of SIMS and MALDI. In this study, the sensitivities of phospholipids mixed with aliphatic carboxylic acids were investigated using Bi‐cluster time‐of‐flight SIMS (TOF‐SIMS). Trans‐aconitic acid (tri‐carboxylic acid) and citric acid (hydroxycarboxylic acid) were used as the matrices. 2,5‐Dihydroxybenzoic acid (DHB), which is a typical aromatic MALDI matrix, was selected as the reference matrix. When trans‐aconitic acid and DHB were used as matrices, the secondary ion yields of [M + H]+ and [2 M + H]+ for phospholipids were approximately 10–150 times higher than that of the pristine lipid. For samples with citric acid, the yield enhancements of [M + H]+ and [2 M + H]+ were approximately 400–1000 times higher than those of pristine lipids. Furthermore, the protonated ionization of citric acid was mostly suppressed because of mixture with phospholipids. These results indicate that the matrix effect between phospholipids and the matrix contributes to the sensitivity enhancement of the target molecules. Hence, aliphatic carboxylic acid was equally or more effective than the MALDI matrix for the sensitivity enhancement of phospholipids in Bi‐cluster TOF‐SIMS.

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Yields and images of secondary ions from organic materials by different primary Bi ions in time‐of‐flight secondary ion mass spectrometry

Cited by 9 publications

References 15 publications

Multimodal Imaging of Chemically Fixed Cells in Preparation for NanoSIMS

Multimodal Imaging of Chemically Fixed Cells in Preparation for NanoSIMS

Depth profiles of aluminum component in sequential infiltration synthesis-treated electron beam resist films analyzed by time-of-flight secondary ion mass spectrometry

Matrix‐enhanced secondary ion mass spectrometry: Effects of aliphatic carboxylic acid matrices on the sensitivity enhancement of biological phospholipids

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