In this paper, a C-shaped pocket tunnel field effect transistor (CSP-TFET) has been designed and optimized based on the traditional double-gate TFETs by introducing a C-shaped pocket region between the source and channel to improve the device performance. A gate-to-pocket overlapping structure is also examined in the proposed CSP-TFET to enhance the gate controllability. The effect of pocket length, pocket doping concentration and gate-to-pocket overlapping structure on the DC and analog/RF characteristics of the CSP-TFET are estimated after calibrating the tunneling model in double-gate TFETs. The DC and analog/RF performance such as on-state current (I
on
), on/off current ratio (I
on
/I
off
), subthreshold swing (SS), transconductance (g
m
), cut-off frequency (f
T
), and gain-bandwidth product (GBP) are investigated. The optimized CSP-TFET device exhibits excellent performance with high I
on
(9.98×10-4 A/μm), high I
on
/I
off
(~1011), as well as low SS (~12 mV/dec). The results reveal that the CSP-TFET device could be a potential alternative for the next generation of semiconductor devices.