“…Two important areas to address these are (i) the instrumentation and (ii) software developments. Instrumentation (i) comprises for example high‐resolution electron microscopes, direct electron detector cameras with higher DQE at high frequencies, energy filters to remove inelastically scattered electrons and reduce the background in the images, correction of the spherical aberration (Cs) to improve the optical system in the column of the microscope, microelectron diffraction to determine the structure from small 3D crystals (Nederlof et al., ; Sawaya et al., ; Shi et al., ), spraying of small amounts on cryo‐EM grids (Chen et al., ; Razinkov et al., ), cryo transfer between FIB and electron microscope for cryo‐ET (Schaffer et al., ) and contrast‐increasing phase plates placed in the back‐focal plane of the microscope (Danev et al., ; Dai et al., ; Frindt et al., ; Walter et al., ; Chua et al., ; Danev et al., ; Glaeser, ; Rhinow ; Khoshouei et al., ); phase plates could facilitate structure determination of relatively small complexes (Khoshouei et al., ), which were difficult to address previously and usually limited to lower resolution (Baird et al., ; Orlov et al., ; Maletta et al., ) even though DDDs have helped a lot moving forward (Merk et al., ), suggesting that synergies will appear for example between phase plates, energy filters and high‐sensitivity cameras to enable high‐contrast high‐resolution image acquisition (a feature that usually contradicts itself considering the requirement of defocussing during data collection to get some reasonable amount of image contrast required for image processing). Further software developments (ii) will be required for automatic data acquisition for massive data collection for single particle cryo‐EM and cryo‐ET ( e.g .…”