2004
DOI: 10.1103/physrevb.70.064502
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Zero-magnetic-field dynamic scaling inBi2Sr2CaCu2O8

Abstract: We investigate the zero-magnetic-field dynamic scaling in Bi 2 Sr 2 CaCu 2 O 8 thin films from nonlinear currentvoltage ͑I-V͒ characteristics and by using the concavity criterion recently proposed by Strachan et al. [Phys. Rev. Lett. 87, 067007 (2001)]. We find that fresh samples show a BKT-like transition with z = 0.8, smaller than expected for a conventional Berezinskii-Kosterlitz-Thouless transition. The effect of sample size and finite Josephson coupling are discussed. We examine the effect of thermally-i… Show more

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Cited by 10 publications
(2 citation statements)
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“…Even though the SPS at absolute zero (T=0) is said to be scales linearly below the quantum critical point (QCP), T-variation of the SPS reveals how the superfluid density varies in such superconducting systems. Current-voltage (IV ) characteristics below T c are found to be very effective to extract the SPS in such systems [24,25].…”
Section: Introductionmentioning
confidence: 99%
“…Even though the SPS at absolute zero (T=0) is said to be scales linearly below the quantum critical point (QCP), T-variation of the SPS reveals how the superfluid density varies in such superconducting systems. Current-voltage (IV ) characteristics below T c are found to be very effective to extract the SPS in such systems [24,25].…”
Section: Introductionmentioning
confidence: 99%
“…13 Measurements on Bi 2 Sr 2 CaCu 2 O 8+δ (BSCCO), a similar hole-doped cuprate superconductor, yield similarly con-flicting results in zero field: in crystals, there has been reported a 2D to 3D crossover 14 as well as a critical regime with multiple exponents; 15 this multiple critical regime has also been observed in thin films, 16 while other measurements on films claim to see 3D diffusive dynamics 17 and still others see a 2D Kosterlitz-Thouless transition in this material. 18 Our work on this complex topic has called into question the method most researchers previously used to analyze the data and has suggested a criterion for determining the existence of a phase transition and also for determining the critical parameters. 6 We have also pointed out the often-overlooked effects of current noise on nonlinear current vs. voltage (I − V ) curves, 19 and argued that the wide range of critical exponents in films of thickness d > ∼ 2000 Å is due to finite size effects limiting the size of the fluctuations.…”
mentioning
confidence: 99%