Zero reflection from a dielectric film on metal substrate at oblique angles of incidence

Kitajima, Hiroe; Fujita, K.; Cizmic, H.

doi:10.1364/ao.23.001937

Cited by 9 publications

(4 citation statements)

References 5 publications

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“…Equation (3) is basic and has been recognized previously.5 7 However, it appears that no attempt has been made to solve it for the film refractive index N 1 when the substrate is absorbing. 8 With N 2 complex r 12 , is also complex.…”

Section: Basic Relationsmentioning

confidence: 99%

Single-layer antireflection coatings on absorbing substrates for the parallel and perpendicular polarizations at oblique incidence

Azzam

1985

Appl. Opt.

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Explicit equations are derived that determine the refractive index of a single layer that suppresses the reflection of p -or s-polarized light from the planar interface between a transparent and an absorbing medium at any given angle of incidence. The required layer thickness and the system reflectance for the orthogonal unextinguished polarization also follow explicitly. This generalizes earlier work that was limited to normal incidence or to oblique incidence at dielectric-dielectric interfaces. Specific examples are given of p-and s-antireflection layers on Si and Al substrates at X = 6328 A at various angles of incidence.

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Section: Basic Relationsmentioning

confidence: 99%

Single-layer antireflection coatings on absorbing substrates for the parallel and perpendicular polarizations at oblique incidence

Azzam

1985

Appl. Opt.

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“…The assumption that the reflection occurs from a homogeneous medium can also be violated by creating a multilayer structure where either the s - or the p - polarized light is reflected and the other polarization is extinguished . The generalized Brewster conditions of a lithography-free planar stack of thin films have been theoretically investigated where the inhomogeneity is due to stacking different materials. − In this case, the GBA corresponds to an angle where electric dipoles in the inhomogeneous stack of materials destructively interfere. An experimental realization of GBA effect of a transparent film on an absorbing substrate, however, has not been demonstrated.…”

mentioning

confidence: 99%

Generalized Brewster Angle Effect in Thin-Film Optical Absorbers and Its Application for Graphene Hydrogen Sensing

et al. 2019

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The generalized Brewster angle (GBA) is the incidence angle at polarization by reflection for p- or s-polarized light. Realizing an s-polarization Brewster effect requires a material with magnetic response, which is challenging at optical frequencies since the magnetic response of materials at these frequencies is extremely weak. Here, we experimentally realize the GBA effect in the visible using a thin-film absorber system consisting of a dielectric film on an absorbing substrate. Polarization by reflection is realized for both p - and s - polarized light at different angles of incidence and multiple wavelengths. We provide a theoretical framework for the generalized Brewster effect in thin-film light absorbers. We demonstrate hydrogen gas sensing using a single-layer graphene film transferred on a thin-film absorber at the GBA with ∼1 fg/mm 2 aerial mass sensitivity. The ultrahigh sensitivity stems from the strong phase sensitivity near the point of darkness, particularly at the GBA, and the strong light–matter interaction in planar nanocavities. These findings depart from the traditional domain of thin films as mere interference optical coatings and highlight its many potential applications including gas sensing and biosensing.

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“…Anti-reflective (AR) coatings are necessary in several applications where losses from reflection of incident optical radiation need to be eliminated 16 . Reflective losses from metallic surfaces can be eliminated by depositing ultra-thin films of absorbing dielectrics on the metal surface 17 18 19 . Mikhail et al .…”

Section: Mechanism Of Visualizationmentioning

confidence: 99%

“…Anti-reflective (AR) coatings are necessary in several applications where losses from reflection of incident optical radiation need to be eliminated [16].Reflective losses from metallic surfaces can be eliminated by depositing ultra-thin films of absorbing dielectrics on the metal surface [17,18,19]. Mikhail et al [10] used ultra-thin Ge films (5-25 nm thick) deposited on gold to achieve anti-reflection condition for enhancing solar energy conversion efficiency.…”

Section: Mechanism Of Visualizationmentioning

confidence: 99%

Bright-field Nanoscopy: Visualizing Nano-structures with Localized Optical Contrast Using a Conventional Microscope

Suran

Bharadwaj

Raghavan

et al. 2016

Sci Rep

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Most methods for optical visualization beyond the diffraction limit rely on fluorescence emission by molecular tags. Here, we report a method for visualization of nanostructures down to a few nanometers using a conventional bright-field microscope without requiring additional molecular tags such as fluorophores. The technique, Bright-field Nanoscopy, is based on the strong thickness dependent color of ultra-thin germanium on an optically thick gold film. We demonstrate the visualization of grain boundaries in chemical vapour deposited single layer graphene and the detection of single 40 nm Ag nanoparticles. We estimate a size detection limit of about 2 nm using this technique. In addition to visualizing nano-structures, this technique can be used to probe fluid phenomena at the nanoscale, such as transport through 2D membranes. We estimated the water transport rate through a 1 nm thick polymer film using this technique, as an illustration. Further, the technique can also be extended to study the transport of specific ions in the solution. It is anticipated that this technique will find use in applications ranging from single-nanoparticles resolved sensing to studying nanoscale fluid-solid interface phenomena.

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Zero reflection from a dielectric film on metal substrate at oblique angles of incidence

Cited by 9 publications

References 5 publications

Single-layer antireflection coatings on absorbing substrates for the parallel and perpendicular polarizations at oblique incidence

Single-layer antireflection coatings on absorbing substrates for the parallel and perpendicular polarizations at oblique incidence

Generalized Brewster Angle Effect in Thin-Film Optical Absorbers and Its Application for Graphene Hydrogen Sensing

Bright-field Nanoscopy: Visualizing Nano-structures with Localized Optical Contrast Using a Conventional Microscope

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