2004
DOI: 10.1063/1.1834732
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Zigzag-shaped magnetic sensors

Abstract: Articles you may be interested inDevelopment of magnetoresistive thin film sensor for magnetic field sensing applications AIP Conf. Proc. 1512, 30 (2013); 10.1063/1.4790897 Domain wall displacement in Py square ring for single nanometric magnetic bead detection Magnetism in zigzag-shaped thin-film elements is investigated using scanning electron microscopy with polarization analysis, magnetotransport measurements, and micromagnetic simulations. We find that the angle of magnetization alternates along the lengt… Show more

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Cited by 14 publications
(11 citation statements)
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“…Magnetic force microscopy (MFM) has been used extensively to image the stray field from domain walls in nanowires, 6,7,13 although great care has to be taken to avoid altering the magnetic state of the nanowires with the magnetic tip used in MFM. Scanning electron microscopy with polarization analysis (SEMPA) 14 and photoelectron emission microscopy (PEEM) 15 provide excellent sensitivity to surface magnetization but samples must be in vacuum and SEMPA cannot image surfaces when magnetic fields are applied to the samples. Lorentz-transmission electron microscopy, 16,17 also performed in vacuum, requires samples to be on electron-transparent substrates and of a minimum thickness (typically 20 nm for Ni 81 Fe 19 ) but nevertheless can produce excellent images of domain wall structure in magnetic nanowires.…”
Section: Introductionmentioning
confidence: 99%
“…Magnetic force microscopy (MFM) has been used extensively to image the stray field from domain walls in nanowires, 6,7,13 although great care has to be taken to avoid altering the magnetic state of the nanowires with the magnetic tip used in MFM. Scanning electron microscopy with polarization analysis (SEMPA) 14 and photoelectron emission microscopy (PEEM) 15 provide excellent sensitivity to surface magnetization but samples must be in vacuum and SEMPA cannot image surfaces when magnetic fields are applied to the samples. Lorentz-transmission electron microscopy, 16,17 also performed in vacuum, requires samples to be on electron-transparent substrates and of a minimum thickness (typically 20 nm for Ni 81 Fe 19 ) but nevertheless can produce excellent images of domain wall structure in magnetic nanowires.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, shorting strips and currents for reset are avoided. Silva et al 18 quote a sensitivity of 3.54 mV/ (V kAm −1 ).…”
Section: Zigzag Amr Sensormentioning
confidence: 98%
“…These advances include zigzag anisotropic magnetometers [1], magnetic tunneling junction sensors with MgO barriers [2,3], magnetoelectric sensors [4,5], microelectromechanical system (MEMS)-based sensors [6], and chip-scale atomic magnetometers [7]. In addition, two topics of less technological interest, namely the magnetoresistance of C 60 molecules with ferromagnetic electrodes [8] and the quantized conductance [9] in break junctions, will be covered because of their scientific interest.…”
Section: Introduction To Magnetometrymentioning
confidence: 99%