2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) 2014
DOI: 10.1109/pvsc.2014.6925433
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Zn as the protective layer for Cu electrode in wafer-Si solar cells

Abstract: Zn is proposed as the protective layer for the Cu electrode in wafer-Si solar cells to replace today's Ag front electrode. Zn provides a lower material cost, a lower resistivity and more abundant material reserve than Sn. The thermal stability of the Zn/Cu/Ni stack is examined by annealing it in air and the Zn/Cu/Ni stack is advantageous over the Sn/Cu/Ni stack in thermal stability. This is attributed to the better coverage of electroplated Zn on Cu and the higher melting point of Zn over Sn. The sheet resista… Show more

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(4 citation statements)
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“…Our previous experiments demonstrate a resistivity of 3 μΩ-cm for electroplated Cu. 5 As discussed later in this paper, we have achieved an Al resistivity of 3.1 μΩ-cm using light-induced Al plating. These values are similar despite the different bulk resistivities as shown in in Table I.…”
Section: Resultsmentioning
confidence: 87%
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“…Our previous experiments demonstrate a resistivity of 3 μΩ-cm for electroplated Cu. 5 As discussed later in this paper, we have achieved an Al resistivity of 3.1 μΩ-cm using light-induced Al plating. These values are similar despite the different bulk resistivities as shown in in Table I.…”
Section: Resultsmentioning
confidence: 87%
“…6 We have demonstrated Zn as the capping layer for Cu. 5 Zn has a few advantages over Sn which include a lower resistivity (5.9 μΩcm vs 11 μΩ-cm), a higher melting point (420 °CC vs 232 °C), and a lower price ($2.66 kg −1 vs $18.92 kg −1 as of November 18, 2020). 1 In contrast, Al is not a deep level impurity in Si and can be placed in direct contact with the Si cell without the need for a barrier layer.…”
Section: Resultsmentioning
confidence: 99%
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