2021
DOI: 10.1016/j.jallcom.2021.159624
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Zn-doped CdO effects on the optical, electrical and photoresponse properties of heterojunctions-based photodiodes

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Cited by 34 publications
(7 citation statements)
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“…The current amounts have increased clearly at reverse biases for increasing light power because electron-hole pairs have formed in the interface of the diodes [28]. In this region, fast current increase appeared for a specific light power illumination condition, and then current values stayed flat after almost −1 V. The increase at current amounts of fabricated Ag/ZnO/p-Si heterostructure for reverse biases with increasing light power intensity highlighted photodiode behavior [29]. In the case of forward biases, there can be seen fast increase at current amount after a threshold voltage value due to Schottky diode behavior of Ag/ZnO/p-Si heterostructure, and then bending occurred owing to series resistance effect.…”
Section: Resultsmentioning
confidence: 89%
“…The current amounts have increased clearly at reverse biases for increasing light power because electron-hole pairs have formed in the interface of the diodes [28]. In this region, fast current increase appeared for a specific light power illumination condition, and then current values stayed flat after almost −1 V. The increase at current amounts of fabricated Ag/ZnO/p-Si heterostructure for reverse biases with increasing light power intensity highlighted photodiode behavior [29]. In the case of forward biases, there can be seen fast increase at current amount after a threshold voltage value due to Schottky diode behavior of Ag/ZnO/p-Si heterostructure, and then bending occurred owing to series resistance effect.…”
Section: Resultsmentioning
confidence: 89%
“…The n values were determined as 2.56, 2.45 and 3.22, for 1%, 3% and 5%, respectively according to ZnO ratio. This case is attributed to the nonideal behavior (current transportation) of poly(AAm-co-HEMA)-ZnO based Si heterojunction diodes, considering the inhomogeneous barrier distribution, series resistance, interface film layer, tunneling effect and interface states, recombination and minority carrier injection [22][23][24]. The ideality factor was found to be 2.36 for the diode based on ZnO thin films synthesized by thermal decomposition method and formed on p-Si [25].…”
Section: Resultsmentioning
confidence: 99%
“…The exponent m was 1.01 and 1.13 for Alq 3 /p-Si and Alq 3 :Y 2 O 3 /p-Si, respectively. The m values indicated that the trap centers inside the energy gap are responsible for enhancement of the photosensitivity. …”
Section: Resultsmentioning
confidence: 99%