2021
DOI: 10.1007/s41779-021-00634-w
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ZnO/Al2O3 layered structures deposited by RF magnetron sputtering on glass: growth characteristics, optical properties, and microstructural analysis

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Cited by 4 publications
(3 citation statements)
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“…Research in the literature made by Tuzemen et.al. has presented almost a similar behavior for the crystallization of ZnO structure on Al2O3 coated glass substrates by RF magnetron sputter technique [14].…”
Section: Resultsmentioning
confidence: 69%
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“…Research in the literature made by Tuzemen et.al. has presented almost a similar behavior for the crystallization of ZnO structure on Al2O3 coated glass substrates by RF magnetron sputter technique [14].…”
Section: Resultsmentioning
confidence: 69%
“…The decreasing thickness values for film annealed at 400°C may be associated with surface morphology, decreased roughness, and perhaps manufacturing conditions. Other studies on this subject have revealed the smooth, and homogeneous nanoscale film surface morphology, and thickness obtained from SEM and TEM images [14,[40][41][42].…”
Section: Figure 3 Plan-view Sem Images Of As-deposited and Annealed B...mentioning
confidence: 80%
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