2023
DOI: 10.21883/jtf.2023.07.55770.89-23
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Использование Морфометрических Величин При Изучении Рельефа Поверхности Рентгенооптических Элементов

Abstract: We studied the use of morphometric variables (maximal curvature, minimal curvature, mean curvature, topographic index, etc.) for study of the surface of X-ray optical elements. We performed calculations on digital elevation models of a spherical concave substrates: primordial and smoothed digital elevation models, before and after technological operations (mechanical lapping, axisymmetric surface shape correction, ion beam figuring). We have demonstrated a visual display of weakly expressed topography inhomoge… Show more

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