The results of testing multilayered Ti/NixMoy heterostructures with a low period of sublayers are presented regarding the practical applicability of a quasi-homogeneous approach with varying the effective scattering length density of thin (thickness 100 nm) films in experiments on specular neutron reflectometry with a changing interface. By changing the effective scattering length density of the films, it proposed to vary the contrast between the components of complex interfaces, thus increasing the sensitivity and information content of the in situ neutron experiment. Structures with different ratios of NixMoy and Ti sublayer thicknesses were synthesized by magnetron sputtering. Based on the analysis of neutron specular reflectivity curves, a conclusion is made about the applicability of the homogeneous approximation.