Определение стехиометрии покрытий AlN радиоактивацией сгустками коллективно ускоренных дейтронов

Abstract

The use of deuteron bunches collectively accelerated in a Luce diode to an average energy of 1200±200 keV and a number of 1013 per shot is shown for the radioactive determination of the stoichiometry of AlN coatings with a known thickness. In each shot, the deuteron energy was determined by measuring the drift velocity of the virtual cathode collectively accelerating deuteron bunches, and the coating stoichiometry was determined with an accuracy of no worse than ±5% from the ratio of the activities of the 28Al/15O radionuclides induced in the nuclear reactions 27Al(d,p)28Al and 14N( d,n)15O, respectively.