上海同步辐射光源纳米三维成像线站设计、研发及调试

Fen, 陶芬 Tao; Ling, 张玲 Zhang; Bo, 苏博 Su; Ruoyang, 高若阳 Gao; Guohao, 杜国浩 Du; Biao, 邓彪 Deng; Honglan, 谢红兰 Xie; Tiqiao, 肖体乔 Xiao

doi:10.3788/aos202242.2334001

Cited by 3 publications

(1 citation statement)

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“…We have built an in-house-designed hard X-ray full-field nano-tomography instrument at BL18B of the Shanghai Synchrotron Radiation Facility (SSRF) (Tao et al, 2022). Beamline BL18B has two kinds of resolution mode: highresolution mode based on a scintillator-lens-coupled camera, and medium-resolution mode based on an X-ray sCMOS camera.…”

Section: Introductionmentioning

confidence: 99%

Full-field hard X-ray nano-tomography at SSRF

Fang¹,

Wang²,

Du³

et al. 2023

J Synchrotron Rad

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An in-house designed transmission X-ray microscopy (TXM) instrument has been developed and commissioned at beamline BL18B of the Shanghai Synchrotron Radiation Facility (SSRF). BL18B is a hard (5–14 keV) X-ray bending-magnet beamline recently built with sub-20 nm spatial resolution in TXM. There are two kinds of resolution mode: one based on using a high-resolution-based scintillator-lens-coupled camera, and the other on using a medium-resolution-based X-ray sCMOS camera. Here, a demonstration of full-field hard X-ray nano-tomography for high-Z material samples (e.g. Au particles, battery particles) and low-Z material samples (e.g. SiO2 powders) is presented for both resolution modes. Sub-50 nm to 100 nm resolution in three dimensions (3D) has been achieved. These results represent the ability of 3D non-destructive characterization with nano-scale spatial resolution for scientific applications in many research fields.

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Section: Introductionmentioning

confidence: 99%