基于改进YOLOv8的光学元件体损伤点检测

Feng Haojie, 冯浩杰; Shi Jinfang, 史晋芳; Qiu Rong, 邱荣; Zhou Qiang, 周强; Wang Jianxin, 王建新; Guo Decheng, 郭德成; Wang Qing, 汪晴

doi:10.3788/lop240590

Laser Optoelectron. Prog.

2024

DOI: 10.3788/lop240590

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基于改进YOLOv8的光学元件体损伤点检测

冯浩杰 Feng Haojie,

史晋芳 Shi Jinfang,

邱荣 Qiu Rong

et al.

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基于改进YOLOv8的光学元件体损伤点检测

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