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Subsurface damage (SSD) induced during the processing of optical components, which are key parts of large optical systems, can deteriorate optical system performance or damage the complete system. To eliminate the SSD of optical components in subsequent processing, it must be accurately detected. This paper presents a review of the principle, characteristics, research status, and development trends of SSD detection methods for optical components. This review finds that destructive detection methods can damage the components and cannot detect SSD online, but they are reliable and accurate and characterized by facile principles, easy implementation, and inexpensive equipment. Consequently, such methods are widely used for the validation of non-destructive methods and quality control of components in industrial production. In comparison, non-destructive detection methods can detect SSD online without destroying the components, shorten the detection cycle, increase the overall production efficiency, and decrease the cost. Therefore, non-destructive detection methods have promising development prospects.
Subsurface damage (SSD) induced during the processing of optical components, which are key parts of large optical systems, can deteriorate optical system performance or damage the complete system. To eliminate the SSD of optical components in subsequent processing, it must be accurately detected. This paper presents a review of the principle, characteristics, research status, and development trends of SSD detection methods for optical components. This review finds that destructive detection methods can damage the components and cannot detect SSD online, but they are reliable and accurate and characterized by facile principles, easy implementation, and inexpensive equipment. Consequently, such methods are widely used for the validation of non-destructive methods and quality control of components in industrial production. In comparison, non-destructive detection methods can detect SSD online without destroying the components, shorten the detection cycle, increase the overall production efficiency, and decrease the cost. Therefore, non-destructive detection methods have promising development prospects.
The subsurface defects (SSD) of optical elements have a significant impact on the service life and laser damage threshold of the inertial confinement nuclear fusion optical system. Due to the optical diffraction limit, fluorescence microscopy has limited image resolution for detecting SSD in optical elements, making it challenging to meet the requirements for precision detection. A super-resolution method is proposed in this paper for detecting SSD in optical elements based on the fluorescence polarization characteristics of CdSe/ZnS quantum dots fluorescence dichroism. By enhancing the imaging sparsity of adjacent fluorophores through a polarization modulated excitation laser and utilizing the fluorescence polarization modulation algorithm, the resolution is achieved beyond the optical diffraction limit. The results demonstrate that the proposed method in this paper can obtain super-resolution images of SSD in optical elements with at least a two-fold increase in lateral resolution. This approach effectively improves detection accuracy for SSD and holds significant guiding significance. In addition, it also has application value for assessing the quality of high-precision optical elements.
The limited excitation efficiency of quantum dots in the detection of subsurface defects in optical elements by quantum dot fluorescence gives rise to insufficient accuracy. To enhance the excitation efficiency of quantum dots, we studied the modulation of the polarization direction of linearly polarized incident light on quantum dot fluorescence. We first apply density matrix evolution theory to study the quantum dots interacting with linearly polarized incident light and emitting fluorescence. The fluorescence intensity exhibits cosine oscillations versus modulated laser polarization. It reaches a maximum value at the polarization angle zero, and then decreases as the angle becomes larger until π/2. The experimental results for the quantum dot in both solutions and subsurface defect of optical elements confirmed these results. For optical elements tagged with CdSe/ZnS quantum dots, the fluorescence intensity increases by 61.7%, and the area for the detected subsurface defects increases by 142.9%. Similarly, for C and InP/ZnS quantum dots, there are also increases in both the fluorescence intensity and the area of subsurface defects. Our study suggests that the subsurface defect detection in optical elements by the linearly polarized incident light could enhance the detection accuracy of subsurface defects in optical elements, and potentially achieve super-resolution imaging of subsurface defects.
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