Specimen preparation is the source of the largest errors in x-ray Ñuorescence analysis. This paper reviews recent publications which deal with various methods of specimen preparation for the analysis of powders, compacted samples and fused specimens, non-destructive analysis of solid samples, direct analysis of solutions, the use of quasi-solid specimens, measurements in "thin layersÏ and various ways of concentrating impurities from solutions and gaseous phases. Based on the literature and the authorsÏ own studies, the best procedures were selected. 1998