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A new method for the extraction of a noise correlation matrix is presented in this paper. This method is based on a kind of reflectometric technique which needs two noise-power measurements corresponding to two different input coefficients for the extraction of the wave correlation matrix. Then, we measure those two noise-power densities emanating from the device under test (DUT) transistor and compute their inverse Fourier transform (FT) in order to find out noise-power behaviors in time domain. Thus, one may apply spectral parametric modeling to this power spectral density (PSD) for the estimation of noise sources that model the DUT noisy two-port. Finally, we calculate the standard noise parameters of the transistor, and the results obtained by this new method are experimentally compared with a conventional method.Index Terms-Correlation matrix, noise figure, noise parameters, noise wave, power spectral density, spectral parametric modeling.

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