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Thin films of Cu x S have successfully been deposited on glass substrates using the Chemical Bath Deposition (CBD) technique. The films were then investigated for their electrical properties. The results showed that the electrical conductivities of the Cu x S films with different molarities (n) of thiourea (Tu), determined using the two-point probe technique, decreased with increase in the molarities of Thiourea. Thus, the conductivity ranged from 1.23 x 10-7-1.3 x 10-1 S/cm.

SCALE 6.1 code system and VENTURE-PC code system has been used for the core conversion of Miniature Neutron Source Reactor (MNSR) from Highly Enriched Uranium (HEU) system (90.2% enriched UAl 4 fuel) to Low Enriched Uranium (LEU) system (19.75% enriched UO 2 -zircaloy-4 fuel). All other structure materials and dimensions of HEU and LEU cores are the same except the increase in the fuel cell diameters for the proposed LEU core. Results obtained show that the peak power density of 4.310033 Watts/cc, maximum neutron density of 6.94535e-6 n/cc, total control rod worth of ሺ723 േ 0.049ሻ pcm, clean cold core excess reactivity of ሺ404 േ 0.009ሻ pcm, k ୣ of ሺ1.0119634 േ 0.0072434ሻ , shutdown margin of ሺ319 േ 0.1003ሻ pcm and neutron flux profile of ሺ1.24 ൈ 10 ଵଶ േ 0.11ሻ ncm ିଶ s ିଵ for the potential LEU core are slightly greater than those of the

Thin film of Cadmium Sulphide (CdS) was deposited onto a precleaned transparent glass substrate by chemical bath deposition technique from a bath containing Cadmium acetate, ammonium acetate, thiourea and ammonium hydroxide. The deposition time was varied from 10 minutes to 50 minutes at an interval of 20 minutes keeping the bath at a constant temperature of  using 78HW-1 constant magnetic stirrer. CdS thin film was characterized by UV-Visible spectrophotometer within the wavelength range of 280 nm – 920 nm using Single – Beam Helios Omega UV – VIS spectrophotometer. The optical parameters; extinction coefficient, refractive index and dielectric constant of CdS thin film were analyzed from the absorption spectra and were found to be affected by the deposition time. The optical band gap energy was obtained by Tauc’s equation and were found to decrease from 3.78 eV – 3.70 eV as the deposition time increases. The dispersion parameters (dispersion energy , oscillation energy , moment of optical dispersion spectra and , static dielectric constant and static refractive index ) were calculated using theoretical Wemple-DiDomenico model. The result show that only  and  behaved differently but other parameters increase as the deposition time increases. The oscillator strength , oscillator wavelength , high frequency dielectric constant and high frequency refractive index were calculated using single Sellmeier oscillator model. While  behaved differently other parameters increase as the deposition time increased. Also, Lattice dielectric constant , N/m* and plasma resonance frequency  were equally obtained. While  decrease with increase in deposition time, N/m* increase with deposition time. The electronic polarizability  of CdS thin film was estimated by Lorenz - Lorentz equation and Clausius Mossotti local field polarizability model. The value is an indication that the films showed good response on the application of photon energy. However, its response reduces as the deposition time increases.