Low field microwave absorption (LFMA) measurements at 9.4 GHz (X-band), were carried out on pulse laser deposited (PLD) polycrystalline B20 cubic structure FeSi thin film grown on Si(111) substrate. The LFMA properties of the films were investigated as a function of DC field, temperature, microwave power and the orientation of DC field with respect to the film surface. The LFMA signal is very strong when the DC field is parallel to the film surface and vanishes at higher angles. The LFMA signal strength increases as the microwave power is increased. The LFMA signal disappears around 340 K, which can be attributed to the disappearance of ferromagnetic state well above room temperature in these films. We believe that domain structure evolution in low fields, which in turn modifies the low field permeability as well as the anisotropy could be the origin of the LFMA observed in these films. The observation of LFMA opens the possibility of the FeSi films to be used as low magnetic field sensors in the microwave and rf frequency regions.
We report pulsed laser deposition synthesis and characterization of polycrystalline Fe1−xCoxSi thin films on Si (111). X-ray diffraction, transmission electron, and atomic force microscopies reveal films to be dense, very smooth, and single phase with a cubic B20 crystal structure. Ferromagnetism with significant magnetic hysteresis is found for all films including nominally pure FeSi films in contrast to the very weak paramagnetism of bulk FeSi. For Fe1−xCoxSi this signifies a change from helimagnetism in bulk, to ferromagnetism in thin films. These ferromagnetic thin films are promising as a magnetic-silicide/silicon system for polarized current production, manipulation, and detection.
Vanadium dioxide thin film nanostructures were synthesized by pulsed laser deposition on soda lime glass at a substrate temperature of 600°C and an oxygen ambient pressure of 15 mTorr. The effect of cooling pressure on the crystalline orientation of VO 2 nanostructures was investigated. As the cooling oxygen pressure is increased, the VO 2 nanostructures exhibit sharp a-axis diffraction peaks, showing the growth of (1 0 0) oriented VO 2 on glass, which is characteristic of the VO 2 monoclinic phase and implies that pure highly a-axis textured VO 2 was formed. We found that the growth mechanism and substrate-film interaction play important roles in the development of these well-textured films via the formation of an interlayer of SiO 2 .
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