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Triple junctions are often initiation points for insulator flashover in pulsed power devices. The twodimensional finite-element TriComp [1] modeling software suite was utilized for its electrostatic field modeling package to investigate electric field behavior in the anode and cathode triple junctions of a high voltage vacuum-insulator interface. TriComp enables simple extraction of values from a macroscopic solution for use as boundary conditions in a subset solution. Electric fields computed with this zoom capability correlate with theoretical analysis of the anode and cathode triple junctions within submicron distances for nominal electrode spacing of 1.0 cm. This paper will discuss the iterative zoom process with TriComp finite-element software and the corresponding theoretical verification of the results. ___________________________________________

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