A comprehensive mapping of the spin polarization of the electronic bands in ferroelectric α-GeTe(111) films has been performed using a time-of-flight momentum microscope equipped with an imaging spin filter that enables a simultaneous measurement of more than 10.000 data points (voxels). A Rashba type splitting of both surface and bulk bands with opposite spin helicity of the inner and outer Rashba bands is found revealing a complex spin texture at the Fermi energy. The switchable inner electric field of GeTe implies new functionalities for spintronic devices. The strong coupling of electron momentum and spin in low-dimensional structures allows an electrically controlled spin manipulation in spintronic devices [1-4], e.g. via the Rashba effect [5]. The Rashba effect has first been experimentally demonstrated in semiconductor heterostructures, where an electrical field perpendicular to the layered structure, i.e. perpendicular to the electron momentum, determines the electron spin orientation relative to its momentum [6-8]. An asymmetric interface structure causes the necessary inversion symmetry breaking and accounts for the special spin-splitting of electron states, the Rashba effect [5], the size of which can be tuned by the strength of the electrical field. For most semiconducting materials the Rashba effect causes only a quite small splitting of the order of 10 −2 ˚ A −1 and thus requires experiments at very low temperatures [9-11] and also implies large lateral dimensions for potential spintronic applications. A considerably larger splitting has been predicted theoretically [12] and was recently found experimentally for the surface states of GeTe(111) [13, 14]. GeTe is a ferroelectric semiconductor with a Curie temperature of 700 K. Thus, besides the interface induced Rashba splitting, the ferroelectric properties also imply a broken inversion symmetry within the bulk and thus would allow for the electrical tuning of the bulk Rashba splitting via switching the ferroelectric polarization [12, 15, 16]. This effect is of great interest for non-volatile spin orbitronics [10]. For GeTe a bulk Rashba splitting of 0.19Å19Å −1 has been predicted theoretically [12]. Experimentally, bulk-Rashba bands are rare and have only been found in the layered polar semiconductors BiTeCl and BiTeI [17-20] that, however, are not switchable. A characterization of the ferroelectric properties and a measurement of the spin polarization of the surface states of GeTe(111) at selected k-points has been performed previously by force microscopy [21, 22] and spin-resolved angular resolved photoemission spectroscopy, respectively [13]. A recent experimental and theoretical study revealed that at the Fermi level the hybridization of surface and bulk states causes surface-bulk resonant states resulting in unconventional spin topologies with chiral symmetry [14]. Here, we demonstrate the spin structure of surface and bulk bands of the GeTe(111) surface using the novel pho-toemission technique of spin-resolved time-of-flight momentum microsco...

Phase Change Materials (PCMs) are unique compounds employed in non-volatile random access memory thanks to the rapid and reversible transformation between the amorphous and crystalline state that display large differences in electrical and optical properties. In addition to the amorphous-to-crystalline transition, experimental results on polycrystalline GeSbTe alloys (GST) films evidenced a Metal-Insulator Transition (MIT) attributed to disorder in the crystalline phase. Here we report on a fundamental advance in the fabrication of GST with out-of-plane stacking of ordered vacancy layers by means of three distinct methods: Molecular Beam Epitaxy, thermal annealing and application of femtosecond laser pulses. We assess the degree of vacancy ordering and explicitly correlate it with the MIT. We further tune the ordering in a controlled fashion attaining a large range of resistivity. Employing ordered GST might allow the realization of cells with larger programming windows.

Sb2Te3 films are used for studying the epitaxial registry between two-dimensionally bonded (2D) materials and three-dimensional bonded (3D) substrates. In contrast to the growth of 3D materials, it is found that the formation of coincidence lattices between Sb2Te3 and Si(111) depends on the geometry and dangling bonds of the reconstructed substrate surface. Furthermore, we show that the epitaxial registry can be influenced by controlling the Si(111) surface reconstruction and confirm the results for ultrathin films.

Weak antilocalization and electron-electron interaction effects are investigated in Sb 2 Te 3 layers. We accomplish smooth top and bottom surfaces for the layer using molecular-beam epitaxy, as revealed by the Kiessig oscillations in the x-ray reflectivity. The two helical surface states of the layer are found to contribute identically to the weak antilocalization effect. They are left intact in spite of low mobility and high concentration of unintentionally doped holes. The magnitude of the electron-electron interaction effect is consistent with the indication that both of the surface states survive in the layer. The robustness of the surface states demonstrates superiority of Sb 2 Te 3 over Bi 2 Se 3 and Bi 2 Te 3 . We also show that the phase-change property of Sb 2 Te 3 provides controllability to switch the existence of the surface states.

The growth of GeTe thin films on a Si(111)-(√3 × √3)R30°-Sb surface is reported. At growth onset, the rapid formation of fully relaxed crystalline GeTe(0001)-(1 × 1) is observed. During growth, a GeTe(0001)-(√3 × √3)R30° surface reconstruction is also detected. Indeed, density functional theory (DFT) simulations indicate that the reconstructed GeTe(0001)-(√3 × √3)R30° structure is energetically competing with the GeTe(0001)-(1 × 1) reconstruction. The out-of-plane α-GeTe<0001>||Si<111> and in-plane α-GeTe<−1010>||Si<−211> epitaxial relationships are confirmed by X-ray diffraction (XRD). Suppression of rotational twist and reduction of twinned domains are achieved. The formation of rotational domains in GeTe grown on Si(111)-(7 × 7) is explained by domain matched coincidence lattice formation with the Si(111)-(1 × 1) surface. Atomic force microscopy (AFM) images show the coalescence of well-oriented islands with subnanometer roughness on their top part. van der Pauw measurements are performed to verify the electric properties of the films. The quality of epitaxial GeTe thin film is discussed and related to the crystalline structure of GeTe and its rhombohedrally distorted resonant bonds.